Phase stability of Ni–Al nanoparticles

The phase stability of Ni–Al clusters of nanometer size was studied by using the embedded atom model and Monte Carlo simulation techniques. For temperatures of 500 and 1000 K and for a range of compositions below 70 at.% Al, the equilibrium structures of the system were determined and compared with...

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Published inJournal of materials research Vol. 14; no. 7; pp. 2849 - 2854
Main Authors de Debiaggi, S. Ramos, Campillo, J. M., Caro, A.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.07.1999
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Summary:The phase stability of Ni–Al clusters of nanometer size was studied by using the embedded atom model and Monte Carlo simulation techniques. For temperatures of 500 and 1000 K and for a range of compositions below 70 at.% Al, the equilibrium structures of the system were determined and compared with the bulk results. We found that the bulk NiAl (B2) and Ni3Al (L12) phases were stable phases in the nanoparticle system; however, for deviations from ideal composition, the analysis revealed that, because of the surface effect, the composition of the clusters was not uniform. There was a core region in which the structure was ordered, B2 or L12, with a composition very close to the ideal, and a chemically disordered mantle region that allocated the deviations from ideal stoichiometries; in this way, a larger phase field appeared, indicating trends similar to those found in experiments on nanocrystalline Ni–Al powder [S.K. Pabi and B.S. Murty, Mater. Sci. Eng. A214, 146 (1996)]. For concentrations between 37 and 51 at.% Al, an intermediate phase, similar to the tetragonal L10 martensite, appeared.
Bibliography:PII:S0884291400050834
istex:2399BF69F6A57864AA772DF888F4B8AECEE4A7F3
ark:/67375/6GQ-P8NTJ1HC-4
ArticleID:05083
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
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ISSN:0884-2914
2044-5326
DOI:10.1557/JMR.1999.0380