Atomic layer deposition-enabled single layer of tungsten trioxide across a large area
[Display omitted] •Single layer of WO3 0.7±0.07nm was synthesized on a large scale by ALD technique.•(tBuN)2W(NMe2)2 as tungsten precursor and H2O as oxygen precursor were used.•ALD deposition at 350°C yields pure, stoichiometric single-layered WO3 films.•The created ALD recipe allows any number of...
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Published in | Applied materials today Vol. 6; pp. 44 - 53 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier Ltd
01.03.2017
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Subjects | |
Online Access | Get full text |
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Summary: | [Display omitted]
•Single layer of WO3 0.7±0.07nm was synthesized on a large scale by ALD technique.•(tBuN)2W(NMe2)2 as tungsten precursor and H2O as oxygen precursor were used.•ALD deposition at 350°C yields pure, stoichiometric single-layered WO3 films.•The created ALD recipe allows any number of atomic WO3 layers to be developed.•Response time of ∼1.0ms was recorder for photodetector based on monolayer WO3.
Reduction from multi-layer to one fundamental layer thickness represents a variety of exotic properties and distinctive applications of such two-dimensional (2D) semiconductor as tungsten trioxide (WO3). This transition without damaging single layer on a large spatial resolution remained elusive until the atomic layer deposition (ALD) technique was utilized. Here we report for the first time the ALD-enabled atomic-layer-precision development of a single layer WO3 with thickness of 0.7±0.07nm across a large area by using (tBuN)2W(NMe2)2 as tungsten precursor and H2O as oxygen precursor, without affecting the underlying SiO2/Si substrate. Versatility of ALD is in tuning recipe in order to achieve the complete WO3 with desired number of WO3 layers including monolayer. Governed by self-limiting surface reactions, the ALD-enabled approach is versatile, scalable and applicable for a broader range of 2D semiconductors and various device applications. Photodetector based on monolayer WO3 exhibited extremely ultra-fast photo-response of ∼1.0ms. |
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ISSN: | 2352-9407 2352-9415 |
DOI: | 10.1016/j.apmt.2016.12.004 |