Characterization and stability monitoring of X-ray focal spots

The characteristics of the X-ray focal spot strongly influence XCT image sharpness and structural resolution. However, current international standards only yield a limited characterization of the focal spot as two perpendicular sizes. Therefore, this paper presents a method for full characterization...

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Bibliographic Details
Published inCIRP annals Vol. 69; no. 1; pp. 453 - 456
Main Authors Probst, Gabriel M., Hou, Qinhan, Boeckmans, Bart, Xiao, YongShun, Dewulf, Wim
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 2020
Subjects
Focal spot
Metrology
X-ray
Metrology
X-ray
Focal spot
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Summary:The characteristics of the X-ray focal spot strongly influence XCT image sharpness and structural resolution. However, current international standards only yield a limited characterization of the focal spot as two perpendicular sizes. Therefore, this paper presents a method for full characterization of the focal spot in terms of both 2D shape and intensity distribution, by applying the inverse Radon transform on a radiograph of a Siemens star. The method is validated through simulations and applied experimentally to two XCT sources. Subsequently, an investigation on how the X-ray tube settings influence focal spot size, shape, intensity and stability is presented.
ISSN:0007-8506
DOI:10.1016/j.cirp.2020.04.072