Nondestructive characterization of the domain structure of periodically poled lithium niobate crystal based on rigorous coupled-wave analysis

We report rigorous coupled-wave analysis（RCWA） method to non-destructively characterize the domain structure of periodically poled lithium niobate（PPLN） crystal. The strong light diffraction effect is achieved by applying a proper external voltage. We can observe reversed domain pattern and employ t...

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Published inOptoelectronics letters Vol. 13; no. 3; pp. 206 - 209
Main Author 田宝璐 陈怀熹 Choge Dismas K 许艺斌 李广伟 梁万国
Format Journal Article
LanguageEnglish
Published Tianjin Tianjin University of Technology 01.05.2017
Springer Nature B.V
Subjects
Crystal structure
Diffraction
Diffraction patterns
Diffraction theory
Lasers
Light diffraction
Lithium niobates
Optical Devices
Optics
Photonics
Physics
Physics and Astronomy
Structural analysis
X-rays
严格耦合波分析
周期极化
无损
最小二乘法拟合
标量衍射理论
畴结构
表征
铌酸锂晶体
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Summary:We report rigorous coupled-wave analysis（RCWA） method to non-destructively characterize the domain structure of periodically poled lithium niobate（PPLN） crystal. The strong light diffraction effect is achieved by applying a proper external voltage. We can observe reversed domain pattern and employ the detected diffraction intensity to optimally fit the result of RCWA based on least square method. Compared with conventional scalar diffraction theory, more accurate domain structure parameters with accuracies of 0.05 μm and 0.005 for the period and duty cycle are obtained respectively. It is proved that accurate, real-time and nondestructive characterization can be realized via this method.
Bibliography:rigorous lithium periodically scalar applying characterize grating realized nondestructive silica
12-1370/TN
We report rigorous coupled-wave analysis（RCWA） method to non-destructively characterize the domain structure of periodically poled lithium niobate（PPLN） crystal. The strong light diffraction effect is achieved by applying a proper external voltage. We can observe reversed domain pattern and employ the detected diffraction intensity to optimally fit the result of RCWA based on least square method. Compared with conventional scalar diffraction theory, more accurate domain structure parameters with accuracies of 0.05 μm and 0.005 for the period and duty cycle are obtained respectively. It is proved that accurate, real-time and nondestructive characterization can be realized via this method.
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ISSN:1673-1905
1993-5013
DOI:10.1007/s11801-017-7049-y