Characterization of an UO2 ceramic via Raman imaging and electron back-scattering diffraction

A surface state analysis of an UO2 ceramic is performed by combining Raman imaging and electron back-scattering diffraction. Special attention is paid to the behavior of the T2g band intensity versus the crystalline orientation. In order to clarify the origin of the T2g intensity variation in the ap...

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Published inMaterials characterization Vol. 147; pp. 280 - 285
Main Authors Maslova, O.A., Iltis, X., Desgranges, L., Ammar, M.R., Genevois, C., de Bilbao, E., Canizarès, A., Barannikova, S.A., Leontyev, I.N., Simon, P.
Format Journal Article
LanguageEnglish
Published Elsevier Inc 01.01.2019
Elsevier
Subjects
Chemical Sciences
Crystalline orientation
Crystallographic indices
EBSD
Euler angles
Material chemistry
Pole figures
Raman imaging
T2g band
UO2
Crystalline orientation
Crystallographic indices
T2g band
Euler angles
UO2
Raman imaging
EBSD
Pole figures
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Summary:A surface state analysis of an UO2 ceramic is performed by combining Raman imaging and electron back-scattering diffraction. Special attention is paid to the behavior of the T2g band intensity versus the crystalline orientation. In order to clarify the origin of the T2g intensity variation in the appropriate Raman image, electron back-scattering diffraction (EBSD) measurements are carried out. EBSD data allow a theoretical estimation of the Raman T2g band intensities. Both maps have been compared in order to correlate them, and to distinguish regions where they are analogous, from those where some physical or chemical effects (stoichiometry, or strains) induce different behavior. More generally, this highlights the interest and the complementarity of combining Raman spectroscopy and EBSD for a better microstructure knowledge.
ISSN:1044-5803
1873-4189
DOI:10.1016/j.matchar.2018.11.006