Application of single crystalline tungsten for fabrication of high resolution STM probes with controlled structure

The possibility to fabricate scanning tunneling microscopy (STM) probes with controlled electronic structure using single crystalline tungsten tips is discussed. High resolution power of oriented single crystalline probes is demonstrated in atomic and subatomic resolution STM studies of silicon, gal...

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Published inRussian metallurgy Metally Vol. 2011; no. 7; pp. 603 - 609
Main Authors Chaika, A. N., Nazin, S. S., Semenov, V. N., Glebovskiy, V. G., Bozhko, S. I., Lübben, O., Krasnikov, S. A., Radican, K., Shvets, I. V.
Format Journal Article
LanguageEnglish
Published Dordrecht SP MAIK Nauka/Interperiodica 01.07.2011
Springer Nature B.V
Subjects
Atomic structure
Chemistry and Materials Science
Crystal structure
Graphite
High resolution
Materials Science
Metallic Materials
Scanning tunneling microscopy
Silicon
Stability
Tungsten
RUSSIAN Metallurgy
High Resolution Power
Graphite Surface
Highly Orient Pyrolytic Graphite
Scanning Tunneling Microscopy Experiment
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Summary:The possibility to fabricate scanning tunneling microscopy (STM) probes with controlled electronic structure using single crystalline tungsten tips is discussed. High resolution power of oriented single crystalline probes is demonstrated in atomic and subatomic resolution STM studies of silicon, gallium telluride and graphite surfaces. The possibility of controllable selection of the tungsten tip atom electron orbitals responsible for the surface imaging in STM experiments is demonstrated.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0036-0295
1555-6255
1531-8648
DOI:10.1134/S0036029511070044