Design-of-Experiments and ALT plan for reliability qualification of chip resistors based on mission profile of AIMDs

Chip resistors are integral components of electronic devices, including Active Implantable Medical Devices. This work, as part of RECOME project, is focusing on developing a methodology for defining accelerated life test plans to qualify chip resistors as per the mission profile of AIMDs. This will...

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Bibliographic Details
Published inMicroelectronics and reliability Vol. 170; p. 115773
Main Authors Indmeskine, F.-E., Saintis, L., Kobi, A., Marceau, H.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.07.2025
Elsevier
Subjects
Applications
Engineering Sciences
Micro and nanotechnologies
Microelectronics
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Summary:Chip resistors are integral components of electronic devices, including Active Implantable Medical Devices. This work, as part of RECOME project, is focusing on developing a methodology for defining accelerated life test plans to qualify chip resistors as per the mission profile of AIMDs. This will be done by combining design of experiments and accelerated life tests associated with failure mechanisms. Defining test protocols, such as thermal cycling, will be a critical component of this work. •A methodology for planning accelerated tests to qualify chip resistors in active implantable medical devices (AIMDs)•Combining design of experiments with accelerated testing•Focusing on failure mechanisms of chip resistors relevant to AIMDS for qualification•Adapting test protocols for chip resistors, such as thermal cycling and electrical overload
ISSN:0026-2714
1872-941X
DOI:10.1016/j.microrel.2025.115773