Growth of a textured quasicrystalline phase in Ti-Ni-Zr films prepared by pulsed laser deposition

The preparation in thin film form of the known icosahedral phase in Ti-Ni-Zr bulk alloys has been investigated as a function of substrate temperature. Films were deposited by pulsed laser deposition on sapphire substrates at temperatures ranging from room temperature to 350 C. Morphological and stru...

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Published inApplied physics. A, Materials science & processing Vol. 76; no. 2; pp. 187 - 195
Main Authors Brien, V., Dauscher, A., Weisbecker, P., Machizaud, F.
Format Journal Article
LanguageEnglish
Published Springer Verlag 01.02.2003
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Summary:The preparation in thin film form of the known icosahedral phase in Ti-Ni-Zr bulk alloys has been investigated as a function of substrate temperature. Films were deposited by pulsed laser deposition on sapphire substrates at temperatures ranging from room temperature to 350 C. Morphological and structural modifications have been followed by grazing-incidence and *c--2*c X-ray diffraction, transmission electron diffraction and imaging. Chemical composition has been analyzed by electron probe microanalysis. The in-depth variation of composition has been studied by secondary neutral mass spectroscopy. We show that pulsed laser deposition at 275 C makes the formation of a 1-*mm-thick film of Ti-Ni-Zr quasicrystalline textured nanocrystallites possible.
Bibliography:ObjectType-Article-2
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ISSN:0947-8396
1432-0630
DOI:10.1007/s003390201405