Depth locating of elements by the PIXE technique

We propose here a method to estimate whether two kinds of elements of different atomic numbers are at the same depth in a sample. A PIXE experiment provides the number of X-rays emitted from these elements when hit by a proton beam at two close lying energies. The variation of these numbers versus e...

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Bibliographic Details
Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 132; no. 3; pp. 521 - 527
Main Authors Lagarde, Gérard, Midy, Pierre, Brissaud, Ivan
Format Journal Article
LanguageEnglish
Published Elsevier B.V 1997
Elsevier
Subjects
Instrumentation and Detectors
Physics
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Summary:We propose here a method to estimate whether two kinds of elements of different atomic numbers are at the same depth in a sample. A PIXE experiment provides the number of X-rays emitted from these elements when hit by a proton beam at two close lying energies. The variation of these numbers versus energy allows one to deduce the desired information on these depths after correcting the effects of atomic numbers. A few examples of applications are presented in order to demonstrate the sensitivity of this procedure.
ISSN:0168-583X
1872-9584
1872-9584
0168-583X
DOI:10.1016/S0168-583X(97)00477-1