Statistical process monitoring for e-waste based on beta regression and particle swarm optimization
PurposeE-waste management can reduce relevant impact of the business activity without affecting reliability, quality or performance. Statistical process monitoring is an effective way for managing reliability and quality to devices in manufacturing processes. This paper proposes an approach for moni...
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Published in | The International journal of quality & reliability management Vol. 39; no. 7; pp. 1663 - 1675 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
Bradford
Emerald Publishing Limited
19.07.2022
Emerald Group Publishing Limited |
Subjects | |
Online Access | Get full text |
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Summary: | PurposeE-waste management can reduce relevant impact of the business activity without affecting reliability, quality or performance. Statistical process monitoring is an effective way for managing reliability and quality to devices in manufacturing processes. This paper proposes an approach for monitoring the proportion of e-waste devices based on Beta regression model and particle swarm optimization. A statistical process monitoring scheme integrating residual useful life techniques for efficient monitoring of e-waste components or equipment was developed.Design/methodology/approachAn approach integrating regression method and particle swarm optimization algorithm was developed for increasing the accuracy of regression model estimates. The control chart tools were used for monitoring the proportion of e-waste devices from fault detection of electronic devices in manufacturing process.FindingsThe results showed that the proposed statistical process monitoring was an excellent reliability and quality scheme for monitoring the proportion of e-waste devices in toner manufacturing process. The optimized regression model estimates showed a significant influence of the process variables for both individually injection rate and toner treads and the interactions between injection rate, toner treads, viscosity and density.Originality/valueThis research is different from others by providing an approach for modeling and monitoring the proportion of e-waste devices. Statistical process monitoring can be used to monitor waste product in manufacturing. Besides, the key contribution in this study is to develop different models for fault detection and identify any change point in the manufacturing process. The optimized model used can be replicated to other Electronic Industry and allows support of a satisfactory e-waste management. |
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ISSN: | 0265-671X 1758-6682 |
DOI: | 10.1108/IJQRM-09-2021-0344 |