Czochralski growth of lead iodide single crystals: Investigations and comparison with the Bridgman method

• Published in: Journal of crystal growth Vol. 318; no. 1; pp. 558 - 562
• Main Authors: Tonn, J., Danilewsky, A.N., Cröll, A., Matuchova, M., Maixner, J.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.03.2011; Elsevier
• Subjects: A1. Characterisation; A1. Crystal morphology; A2. Bridgman technique; A2. Czochralski method; B1. Halides; B2. Semiconducting lead compounds; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Growth from melts; zone melting and refining; Materials science; Methods of crystal growth; physics of crystal growth; Methods of deposition of films and coatings; film growth and epitaxy; Physics; Theory and models of film growth; A2. Bridgman technique; A1. Characterisation; B1. Halides; B2. Semiconducting lead compounds; A2. Czochralski method; A1. Crystal morphology; Electron backscattering; Semiconductor materials; Electron diffraction; Crystal seeds; Czochralski method; Lead compounds; XRD; Silica; Lead iodide; Monocrystals; Halides; Rocking curve; Growth mechanism; Crystal morphology; Bridgman method; Crystal growth from melts; Crystal structure
• ISSN: 0022-0248; 1873-5002
• DOI: 10.1016/j.jcrysgro.2010.10.059

We have developed a procedure to grow lead iodide (PbI2, 2H type) crystals using the Czochralski method applying an Ar counter pressure inside a fused silica chamber. The resulting crystal has a length of 3cm and is free of cracks. Electron backscatter diffraction (EBSD) measurements demonstrate that the crystal grew along [112¯0] direction (c-axis perpendicular to growth direction), which was defined by the PbI2 seed. This means that a better control of the growth direction is possible using the Czochralski method. The EBSD patterns suggest a simplified preparation method of the very soft crystals using samples with a surface orientation perpendicular to (0001). Rocking curves measured by high resolution X-ray diffraction (HRXRD) indicate that the structural quality of the approximately 80% single crystalline material is comparable to Bridgman–Stockbarger-grown crystals.