Dependence of intermetallic compound formation on the sublayer stacking sequence in Ag–Sn bilayer thin films
Intermetallic compound (IMC) formation in thermally-evaporated Ag–Sn bilayer thin films has been investigated employing especially X-ray diffraction (XRD) and (S)TEM methods. The specific IMCs that are present in the as-deposited state depend sensitively on the stacking sequence of the sublayers. In...
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Published in | Acta materialia Vol. 103; pp. 174 - 183 |
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Language | English |
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Abstract | Intermetallic compound (IMC) formation in thermally-evaporated Ag–Sn bilayer thin films has been investigated employing especially X-ray diffraction (XRD) and (S)TEM methods. The specific IMCs that are present in the as-deposited state depend sensitively on the stacking sequence of the sublayers. In case of Sn on top of Ag, predominantly Ag3Sn is formed, whereas Ag4Sn is predominantly present in the as-deposited state for Ag on top of Sn. In the latter case this is accompanied by an extremely fast uptake of a large amount of Sn by the Ag sublayer, leaving behind macroscopic voids in the Sn sublayer. The results are discussed on the basis of the thermodynamics and kinetics of (IMC) product-layer growth in thin films. It is shown that both thermodynamic and kinetic arguments explain the contrasting phenomena observed.
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AbstractList | Intermetallic compound (IMC) formation in thermally-evaporated Ag–Sn bilayer thin films has been investigated employing especially X-ray diffraction (XRD) and (S)TEM methods. The specific IMCs that are present in the as-deposited state depend sensitively on the stacking sequence of the sublayers. In case of Sn on top of Ag, predominantly Ag3Sn is formed, whereas Ag4Sn is predominantly present in the as-deposited state for Ag on top of Sn. In the latter case this is accompanied by an extremely fast uptake of a large amount of Sn by the Ag sublayer, leaving behind macroscopic voids in the Sn sublayer. The results are discussed on the basis of the thermodynamics and kinetics of (IMC) product-layer growth in thin films. It is shown that both thermodynamic and kinetic arguments explain the contrasting phenomena observed.
[Display omitted] Intermetallic compound (IMC) formation in thermally-evaporated Ag-Sn bilayer thin films has been investigated employing especially X-ray diffraction (XRD) and (S)TEM methods. The specific IMCs that are present in the as-deposited state depend sensitively on the stacking sequence of the sublayers. In case of Sn on top of Ag, predominantly Ag3Sn is formed, whereas Ag4Sn is predominantly present in the as-deposited state for Ag on top of Sn. In the latter case this is accompanied by an extremely fast uptake of a large amount of Sn by the Ag sublayer, leaving behind macroscopic voids in the Sn sublayer. The results are discussed on the basis of the thermodynamics and kinetics of (IMC) product-layer growth in thin films. It is shown that both thermodynamic and kinetic arguments explain the contrasting phenomena observed. |
Author | Mittemeijer, E.J. Rossi, P.J. Zotov, N. Bischoff, E. |
Author_xml | – sequence: 1 givenname: P.J. surname: Rossi fullname: Rossi, P.J. email: p.rossi@is.mpg.de organization: Max Planck Institute for Intelligent Systems (formerly Max Planck Institute for Metals Research), Heisenbergstraße 3, 70569 Stuttgart, Germany – sequence: 2 givenname: N. surname: Zotov fullname: Zotov, N. email: n.zotov@is.mpg.de organization: Max Planck Institute for Intelligent Systems (formerly Max Planck Institute for Metals Research), Heisenbergstraße 3, 70569 Stuttgart, Germany – sequence: 3 givenname: E. surname: Bischoff fullname: Bischoff, E. email: e.bischoff@is.mpg.de organization: Max Planck Institute for Intelligent Systems (formerly Max Planck Institute for Metals Research), Heisenbergstraße 3, 70569 Stuttgart, Germany – sequence: 4 givenname: E.J. surname: Mittemeijer fullname: Mittemeijer, E.J. email: e.j.mittemeijer@is.mpg.de organization: Max Planck Institute for Intelligent Systems (formerly Max Planck Institute for Metals Research), Heisenbergstraße 3, 70569 Stuttgart, Germany |
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Snippet | Intermetallic compound (IMC) formation in thermally-evaporated Ag–Sn bilayer thin films has been investigated employing especially X-ray diffraction (XRD) and... Intermetallic compound (IMC) formation in thermally-evaporated Ag-Sn bilayer thin films has been investigated employing especially X-ray diffraction (XRD) and... |
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SubjectTerms | Formations Interdiffusion Intermetallic compounds Intermetallic compounds (IMCs) Intermetallics Kinetics Silver Stacking Thermodynamics Thin films Tin |
Title | Dependence of intermetallic compound formation on the sublayer stacking sequence in Ag–Sn bilayer thin films |
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