Dependence of Junction Voltage Saturation on Uniformity and Quality of Laser Diode Bars

The dependence of the sinkage at the threshold of the electric derivative curve (IdV/dI-I) on the uniformity and the quality of the laser diode bar is analyzed. By using the equations derived from the equivalent circuits of the bars, the influence of the bar uniformity on the depth of the dip is inv...

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Bibliographic Details
Published inChinese physics letters Vol. 26; no. 12; pp. 225 - 228
Main Author 梁庆成 石家纬 郭树旭 刘奎学 曹军胜
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.12.2009
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Summary:The dependence of the sinkage at the threshold of the electric derivative curve (IdV/dI-I) on the uniformity and the quality of the laser diode bar is analyzed. By using the equations derived from the equivalent circuits of the bars, the influence of the bar uniformity on the depth of the dip is investigated in theory under certain conditions. Furthermore, the experimental results based on the presented technique indicate that the depth of the dip is interrelated to the uniformity and the quality of the corresponding bar. The present technique can be used conveniently and effectively to measure the laser diode bars in practice.
Bibliography:11-1959/O4
TN248.1
F719
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/26/12/127504