Resistor and dielectric properties of carbon-black epoxy resin composites

In this paper, the change in carbon black (CB) coherence with CB loading in CB resin composites has been studied from the viewpoint of resistance characteristics (resistivity, temperature coefficient of resistance) and dielectric properties by using HS 500 as CB. Equivalent circuit parameters (Rs, R...

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Published inElectronics & communications in Japan. Part 2, Electronics Vol. 75; no. 3; pp. 109 - 116
Main Authors Nakamura, Shuhei, Ito, Atushi, Sawa, Goro, Kitagawa, Keiichi
Format Journal Article
LanguageEnglish
Published New York Wiley Subscription Services, Inc., A Wiley Company 1992
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Summary:In this paper, the change in carbon black (CB) coherence with CB loading in CB resin composites has been studied from the viewpoint of resistance characteristics (resistivity, temperature coefficient of resistance) and dielectric properties by using HS 500 as CB. Equivalent circuit parameters (Rs, Rc, and Cc) for these composites also are used for comparison. The dielectric properties have been obtained from a complex relative dielectric constant evaluated from the reflection and transmission coefficients at the frequency of 300 kHz to 3 GHz. The parameters for the equivalent circuit have been obtained from the frequency dependence of relative dielectric constant and the dc conductivity. As the CB loading increases, the dc resistivity decreases and Rs and Rc also decrease. This corresponds to the increase in the number of conductive paths formed by the CB structure bridging the electrodes. From the decrease of the positive TCR value, it is considered that a mechanically strong coherence was formed between the CB structure with an increase of the CB loading. Also, from the increase in the strength of relaxation and Cc with the CB loading, the branching of the CB structure which branches out of the conduction path bridging the electrodes has been found to increase. In this case, a parameter βd which is a measure of the distribution of the relaxation time increased.
Bibliography:ark:/67375/WNG-DQK0ZZ54-F
istex:B571D089120EDA51CD5C55AFCC7F61717AEC683F
ArticleID:ECJB4420750311
Graduated in 1965 from Kanazawa University. He also has a Ph.D. He became a Research Associate at Gifu National College of Technology in 1966, an Associate Professor in 1977, and a full Professor in 1989. In addition to research on the insulation characteristics of organic high‐polymer thin films by a self‐healing breakdown method, he has currently been engaged in research on the electrical properties of composite dielectrics at high frequency. He is a member of the Institute of Electrical Engineers of Japan.
Graduated in 1977 from Tsu Technical High School. In the same year he became a technician at Mie University. In 1986 he graduated from Mie Junior College.
Received a B.S.E.E. and a Ph.D. from Nagoya University in 1960 and 1965, respectively. He was a Research Associate and then an Associate Professor at Nagoya University in 1969, a full Professor at Mie University in 1976, and Dean of the Faculty of Engineering from 1988 to 1991. He has been engaged in research on the electrical properties of dielectric materials and the high‐voltage electrical phenomena of composite insulators and education. For one year, from August 1969, he was at Sanford University, U.K., where he engaged in research on the electrical properties of dielectric surfaces. In 1970, he received a Best Paper Award from the Institute of Electrical Engineers of Japan. He is a member of the Physical Society of Japan; Institute of Electrical Engineers of Japan; and the Society of Polymer Science, Japan.
Obtained an M.S. in 1973 from Shinshu University and a Ph.D. in 1976 from Nagoya University. He is currently an Associate Professor at Mie University. He is engaged in research on electrical properties of high polymer materials.
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ISSN:8756-663X
1520-6432
DOI:10.1002/ecjb.4420750311