Investigation of shear force of a single adhesion cell using a self-sensitive cantilever and fluorescence microscopy

• Published in: Japanese Journal of Applied Physics Vol. 54; no. 8S2; pp. 8 - 14
• Main Authors: Hashimoto, Shigetaka, Adachi, Makoto, Iwata, Futoshi
• Format: Journal Article
• Language: English
• Published: The Japan Society of Applied Physics 01.08.2015
• ISSN: 0021-4922; 1347-4065
• DOI: 10.7567/JJAP.54.08LB03

In this paper, we describe a measurement system based on an atomic force microscope (AFM) for the measurement of the shear force and detachment energy of a single adhesion cell on a substrate. The shear force was quantitatively measured from the deflection of a self-sensitive cantilever that was employed for the simple configuration of the AFM manipulator. The shear force behavior of a single cell detaching from the substrate was observed. By staining cells with a fluorescence dye, the deformation shape of the cell being pushed with the cantilever could be clearly observed. The shear force and detachment energy of the cell increased with the size of the cell. The difference in the shear force of single cells on different substrates with different surface energies was quantitatively evaluated. The loading force applied to a single cell increased with the feed speed of the cantilever. The viability of cells after measurement under different feed speeds of the cantilever was also evaluated.