Characterization of shocked beryllium
While numerous studies have investigated the low-strain-rate constitutive response of beryllium, the combined influence of high strain rate and temperature on the mechanical behavior and microstructure of beryllium has received limited attention over the last 40 years. In the current work, high stra...
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Published in | EPJ Web of conferences Vol. 26; pp. 1009 - 1014 |
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Main Authors | , , , , , , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
United States
EDP Sciences
2012
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Subjects | |
Online Access | Get full text |
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Summary: | While numerous studies have investigated the low-strain-rate constitutive response of beryllium, the combined influence of high strain rate and temperature on the mechanical behavior and microstructure of beryllium has received limited attention over the last 40 years. In the current work, high strain rate tests were conducted using both explosive drive and a gas gun to accelerate the material. Prior studies have focused on tensile loading behavior, or limited conditions of dynamic strain rate and/or temperature. Two constitutive strength (plasticity) models, the Preston-Tonks-Wallace (PTW) and Mechanical Threshold Stress (MTS) models, were calibrated using common quasi-static and Hopkinson bar data. However, simulations with the two models give noticeably different results when compared with the measured experimental wave profiles. The experimental results indicate that, even if fractured by the initial shock loading, the Be remains sufficiently intact to support a shear stress following partial release and subsequent shock re-loading. Additional “arrested” drive shots were designed and tested to minimize the reflected tensile pulse in the sample. These tests were done to both validate the model and to put large shock induced compressive loads into the beryllium sample. |
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Bibliography: | other:2012EPJWC..2601009C istex:3D4A9F8B4EDF4FB2B176E1C4691291EAE373E499 publisher-ID:epjconf_dymat2012_01009 ark:/67375/80W-314NP5LV-J DOE/LANL AC52-06NA25396 LA-UR-12-24304 |
ISBN: | 2759807576 9782759807574 |
ISSN: | 2100-014X 2100-014X |
DOI: | 10.1051/epjconf/20122601009 |