Application of image plate for structural studies of carbon nanotubes by high-energy X-ray diffraction
An image plate detector coupled with high-energy synchrotron radiation was used to determine the structure factor and the radial distribution function of carbon nanotubes obtained by a template CVD process. The image plate detector has proved to be a very efficient tool for structural studies of nan...
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| Published in | Journal of alloys and compounds Vol. 401; no. 1; pp. 51 - 54 |
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| Main Authors | , , , , , |
| Format | Journal Article Conference Proceeding |
| Language | English |
| Published |
Lausanne
Elsevier B.V
29.09.2005
Elsevier |
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| Abstract | An image plate detector coupled with high-energy synchrotron radiation was used to determine the structure factor and the radial distribution function of carbon nanotubes obtained by a template CVD process. The image plate detector has proved to be a very efficient tool for structural studies of nanotubes providing diffraction data of good quality in relatively short time. The diffraction data were converted to real space yielding the radial distribution function which can be used for quantitative analysis of the atomic arrangement of the carbon nanotubes. The obtained results are compared to those of traditional experiments using a conventional point Ge detector. |
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| AbstractList | An image plate detector coupled with high-energy synchrotron radiation was used to determine the structure factor and the radial distribution function of carbon nanotubes obtained by a template CVD process. The image plate detector has proved to be a very efficient tool for structural studies of nanotubes providing diffraction data of good quality in relatively short time. The diffraction data were converted to real space yielding the radial distribution function which can be used for quantitative analysis of the atomic arrangement of the carbon nanotubes. The obtained results are compared to those of traditional experiments using a conventional point Ge detector. |
| Author | Burian, A. Dore, J.C. Hawelek, L. Honkimäki, V. Koloczek, J. Kyotani, T. |
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| Cites_doi | 10.1016/S0925-8388(03)00604-2 10.1080/07303300310001634952 10.1016/j.molliq.2003.08.013 10.1016/0022-3093(95)00095-X 10.1080/08957959608201408 10.1016/j.diamond.2003.10.050 10.1107/S0021889803017564 10.1002/9780470142776.ch1 10.1080/00268979650027720 10.1021/cm960063+ 10.1038/354056a0 10.1107/S0567739475001295 10.1016/j.ssc.2003.10.007 10.1002/bbpc.19961000812 10.1107/S0108767394013292 10.1016/j.diamond.2003.10.057 10.1088/0022-3719/2/2/305 |
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| Keywords | X-ray diffraction Synchrotron radiation Nanostructures Image sensors High energy radiation Structure factors Atomic arrangement Radial distribution function Carbon nanotubes Experimental device XRD |
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| SubjectTerms | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals Nanostructures Physics Structure of solids and liquids; crystallography Synchrotron radiation X-ray diffraction |
| Title | Application of image plate for structural studies of carbon nanotubes by high-energy X-ray diffraction |
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