Application of image plate for structural studies of carbon nanotubes by high-energy X-ray diffraction

An image plate detector coupled with high-energy synchrotron radiation was used to determine the structure factor and the radial distribution function of carbon nanotubes obtained by a template CVD process. The image plate detector has proved to be a very efficient tool for structural studies of nan...

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Bibliographic Details
Published inJournal of alloys and compounds Vol. 401; no. 1; pp. 51 - 54
Main Authors Hawelek, L., Koloczek, J., Burian, A., Dore, J.C., Honkimäki, V., Kyotani, T.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Lausanne Elsevier B.V 29.09.2005
Elsevier
Subjects
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals
Nanostructures
Physics
Structure of solids and liquids; crystallography
Synchrotron radiation
X-ray diffraction
X-ray diffraction
Synchrotron radiation
Nanostructures
Image sensors
High energy radiation
Structure factors
Atomic arrangement
Radial distribution function
Carbon nanotubes
Experimental device
XRD
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Summary:An image plate detector coupled with high-energy synchrotron radiation was used to determine the structure factor and the radial distribution function of carbon nanotubes obtained by a template CVD process. The image plate detector has proved to be a very efficient tool for structural studies of nanotubes providing diffraction data of good quality in relatively short time. The diffraction data were converted to real space yielding the radial distribution function which can be used for quantitative analysis of the atomic arrangement of the carbon nanotubes. The obtained results are compared to those of traditional experiments using a conventional point Ge detector.
ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2005.02.061