A technique for high-power microwave diagnostics of large-area homogeneous HTS films
A new technique and measuring equipment for determination of the dependence of HTS surface resistance on a microwave magnetic field amplitude, R/sub s/(H), were developed. The measuring system was an open 36 GHz resonator formed between a spherical metal surface and a flat HTS film. The microwave sc...
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Published in | IEEE transactions on applied superconductivity Vol. 9; no. 2; pp. 2125 - 2128 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
IEEE
01.06.1999
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Subjects | |
Online Access | Get full text |
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Summary: | A new technique and measuring equipment for determination of the dependence of HTS surface resistance on a microwave magnetic field amplitude, R/sub s/(H), were developed. The measuring system was an open 36 GHz resonator formed between a spherical metal surface and a flat HTS film. The microwave scheme included a high-power pumping wave circuit and a spectrally separated low-power diagnostic signal circuit. The H structure inhomogeneity on the HTS surface was taken into account. Measurements of the averaged surface resistance <R/sub s/(H)> have shown it to be related with R/sub s/(H) by the integral equation. The technique for solution of the integral equation based on the Tikhonov method extended from the theory of incorrect inverse problems was applied. Some results of R/sub s/(H) measurements for large-area (>35 mm) YBCO films deposited onto NdGaO/sub 3/, LaAlO/sub 3/ substrates are presented and discussed. |
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Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Feature-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Article-3 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 |
ISSN: | 1051-8223 1558-2515 |
DOI: | 10.1109/77.784887 |