Characterization of mobile type I and type II twin boundaries in 10M modulated Ni–Mn–Ga martensite by electron backscatter diffraction

Mobile type I and type II twin boundaries mediating the magnetic field-induced strain in five-layered modulated (10M) Ni–Mn–Ga martensite were analyzed by electron backscatter diffraction. Taking into account the slight monoclinic distortion of the pseudo-tetragonal lattice, the electron backscatter...

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Bibliographic Details
Published inActa materialia Vol. 61; no. 6; pp. 1913 - 1920
Main Authors Chulist, R., Straka, L., Lanska, N., Soroka, A., Sozinov, A., Skrotzki, W.
Format Journal Article
LanguageEnglish
Published Kidlington Elsevier Ltd 01.04.2013
Elsevier
Subjects
Applied sciences
EBSD
Exact sciences and technology
Magnetic shape memory alloy
Metals. Metallurgy
Ni–Mn–Ga
Twinning
Twinning
Ni–Mn–Ga
Magnetic shape memory alloy
EBSD
Magnetic alloy
Shape memory alloy
Twin boundary
Magnetic material
Electron diffraction
Ni-Mn-Ga
Martensite
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Summary:Mobile type I and type II twin boundaries mediating the magnetic field-induced strain in five-layered modulated (10M) Ni–Mn–Ga martensite were analyzed by electron backscatter diffraction. Taking into account the slight monoclinic distortion of the pseudo-tetragonal lattice, the electron backscatter diffraction study reveals domains of 0.01–1mm thickness adjacent to the type I and type II twin boundaries. The domains differing in the modulation direction are {100) compound twins and their effect on twinning stress is discussed. Detailed analysis of type II twin boundary reveals that the domains are further internally twinned by compound {110) twins 1–15μm in size. An additional example of a complex twin microstructure combining type I and type II twin boundaries is presented.
ISSN:1359-6454
1873-2453
DOI:10.1016/j.actamat.2012.12.012