Corroded surface roughness of copper analyzed by Fourier transform infrared mapping microscopy and optical profilometric study
This study shows the effects of roughness on infrared spectra shapes of thin corrosion products on metallic substrates. The calculated spectra show that the baseline is mainly affected by increasing roughness and that such effects do not shift the position of the absorption bands. The model obtained...
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| Published in | Applied spectroscopy Vol. 58; no. 2; p. 179 |
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| Main Authors | , , |
| Format | Journal Article |
| Language | English |
| Published |
United States
01.02.2004
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| Online Access | Get more information |
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| Summary: | This study shows the effects of roughness on infrared spectra shapes of thin corrosion products on metallic substrates. The calculated spectra show that the baseline is mainly affected by increasing roughness and that such effects do not shift the position of the absorption bands. The model obtained has been used to extract data of artificial patina on a copper surface. Surface defects of copper substrates can be distinguished on the whole surface, from the morphological and chemical points of view, using optical profilometry and infrared microspectroscopy. An homogeneous layer of cuprite covers the surface except in the linear defects. Fourier transform infrared (FT-IR) analysis indicates that a mixture of atacamite and clinoatacamite is mainly located in these scratches. The width of these particular areas is in good agreement with profilometric observations. |
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| ISSN: | 0003-7028 |
| DOI: | 10.1366/000370204322842904 |