Angle-resolved X-ray photoemission electron microscopy

• Published in: Journal of electron spectroscopy and related phenomena Vol. 185; no. 10; pp. 323 - 329
• Main Authors: Menteş, Tevfik Onur, Locatelli, Andrea
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.10.2012
• Subjects: ARPES; Darkfield; Diffraction; Electron microscopy; Electronic structure; Imaging; LEEM; Microprobe; Oxides; Photoemission; Synchrotrons; XPEEM; Microprobe; XPEEM; LEEM; ARPES; Darkfield

► Microprobe ARPES is successfully applied to studies on graphene. ► We propose a novel approach by applying dark field methods to XPEEM. ► The lateral resolution in dark field XPEEM is better than 40nm. ► Dark field XPEEM is applied to O/W(110) to determine adsorption site symmetry. Synchrotron bas...