A method to improve spectral resolution in planar semiconductor gamma-ray detectors

This paper describes an empirically derived algorithm to compensate for charge trapping in CdTe, CdZnTe, and other planar semiconductor detectors. The method is demonstrated to be an improvement over available systems, and application to experimental data is shown.

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 43; no. 3; pp. 1365 - 1368
Main Authors Keele, B.D., Addleman, R.S., Troyer, G.L.
Format Journal Article
LanguageEnglish
Published IEEE 01.06.1996
Subjects
Coaxial components
Costs
Electron traps
Gamma ray detection
Gamma ray detectors
Instruments
Partial response channels
Pulse shaping methods
Region 1
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Summary:This paper describes an empirically derived algorithm to compensate for charge trapping in CdTe, CdZnTe, and other planar semiconductor detectors. The method is demonstrated to be an improvement over available systems, and application to experimental data is shown.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9499
1558-1578
DOI:10.1109/23.507066