Yttria-stabilized zirconia thin film electrolyte produced by RF sputtering for solid oxide fuel cell applications

Thin film (40–600 nm) yttria-stabilized zirconia (YSZ) electrolytes for solid oxide fuel cells (SOFC) were deposited on NiO-YSZ anodes and fused silica substrates by RF sputtering, using low applied power without the use of post deposition annealing heat treatment. YSZ film showed a nanocrystalline...

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Bibliographic Details
Published inMaterials letters Vol. 64; no. 22; pp. 2450 - 2453
Main Authors Smeacetto, Federico, Salvo, Milena, Ajitdoss, Lakshmi Chandru, Perero, Sergio, Moskalewicz, Tomasz, Boldrini, Stefano, Doubova, Lioudmila, Ferraris, Monica
Format Journal Article
LanguageEnglish
Published Elsevier B.V 30.11.2010
Subjects
Anodes
Ceramics
Deposition
Electrolytes
Microstructure
Nanomaterials
Radio frequencies
Solid oxide fuel cells
Sputtering
Thin films
Yttria stabilized zirconia
Thin films
Nanomaterials
Ceramics
Microstructure
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Summary:Thin film (40–600 nm) yttria-stabilized zirconia (YSZ) electrolytes for solid oxide fuel cells (SOFC) were deposited on NiO-YSZ anodes and fused silica substrates by RF sputtering, using low applied power without the use of post deposition annealing heat treatment. YSZ film showed a nanocrystalline structure and consisted of the Zr .85Y .15O 1.93 (fcc) phase. The film was dense and the YSZ/anode interface was continuous and crack free. According to preliminary in-plane conductivity measurements (temperature range 550–750 °C) on the YSZ film, the activation energy for ionic conduction was found to be 1.18 ± 0.01 eV.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0167-577X
1873-4979
DOI:10.1016/j.matlet.2010.08.016