1/ f, g–r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices

In this paper the theoretical analysis of noise sources in Optoelectronic Coupled Devices (OCDs) is given and the relation between typical defects and 1/ f, g–r and burst noise is described. According to statistical and experimental results, a threshold to screen potential devices with excess noise...

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Bibliographic Details
Published inMicroelectronics and reliability Vol. 40; no. 1; pp. 171 - 178
Main Authors Xu, Jiansheng, Abbott, Derek, Dai, Yisong
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.01.2000
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Summary:In this paper the theoretical analysis of noise sources in Optoelectronic Coupled Devices (OCDs) is given and the relation between typical defects and 1/ f, g–r and burst noise is described. According to statistical and experimental results, a threshold to screen potential devices with excess noise is derived, which has been proved theoretically that the screening criterion is reasonable. Moreover, the experimental results show that the method is of practical value.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0026-2714
1872-941X
DOI:10.1016/S0026-2714(99)00221-8