1/ f, g–r and burst noise used as a screening threshold for reliability estimation of optoelectronic coupled devices
In this paper the theoretical analysis of noise sources in Optoelectronic Coupled Devices (OCDs) is given and the relation between typical defects and 1/ f, g–r and burst noise is described. According to statistical and experimental results, a threshold to screen potential devices with excess noise...
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Published in | Microelectronics and reliability Vol. 40; no. 1; pp. 171 - 178 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Elsevier Ltd
01.01.2000
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Online Access | Get full text |
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Summary: | In this paper the theoretical analysis of noise sources in Optoelectronic Coupled Devices (OCDs) is given and the relation between typical defects and 1/
f, g–r and burst noise is described. According to statistical and experimental results, a threshold to screen potential devices with excess noise is derived, which has been proved theoretically that the screening criterion is reasonable. Moreover, the experimental results show that the method is of practical value. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0026-2714 1872-941X |
DOI: | 10.1016/S0026-2714(99)00221-8 |