Experimental study on the single event effects in pulse width modulators by laser testing

This paper presents single event effect（SEE） characteristics of UC1845 AJ pulse width modulators（PWMs） by laser testing. In combination with analysis to map PWM circuitry in the microchip dies, the typical SEE response waveforms for laser pulses located in different circuit blocks of UC1845 AJ are o...

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Bibliographic Details
Published inJournal of semiconductors Vol. 36; no. 11; pp. 101 - 105
Main Author 赵雯 郭晓强 陈伟 郭红霞 林东生 王汉宁 罗尹虹 丁李利 王园明
Format Journal Article
LanguageEnglish
Published Chinese Institute of Electronics 01.11.2015
Subjects
Circuits
laser simulation
Lasers
Modulators
Pulse duration modulation
Pulse width
pulse width modulator
PWM电路
Semiconductors
single event effect
Single Event Effects
Waveforms
单粒子效应
实验
激光测试
激光脉冲
脉冲宽度调制器
脉宽调制器
输出脉冲
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ISSN1674-4926
DOI10.1088/1674-4926/36/11/115008

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Summary:This paper presents single event effect（SEE） characteristics of UC1845 AJ pulse width modulators（PWMs） by laser testing. In combination with analysis to map PWM circuitry in the microchip dies, the typical SEE response waveforms for laser pulses located in different circuit blocks of UC1845 AJ are obtained and the SEE mechanisms are analyzed. The laser SEE test results show that there are some differences in the SEE mechanisms of different circuit blocks, and phase shifts or changes in the duty cycles of few output pulses are the main SEE behaviors for UC1845 AJ. In addition, a new SEE behavior which manifests as changes in the duty cycles of many output pulses is revealed. This means that an SEE hardened design should be considered.
Bibliography:laser simulation; pulse width modulator; single event effect
11-5781/TN
This paper presents single event effect（SEE） characteristics of UC1845 AJ pulse width modulators（PWMs） by laser testing. In combination with analysis to map PWM circuitry in the microchip dies, the typical SEE response waveforms for laser pulses located in different circuit blocks of UC1845 AJ are obtained and the SEE mechanisms are analyzed. The laser SEE test results show that there are some differences in the SEE mechanisms of different circuit blocks, and phase shifts or changes in the duty cycles of few output pulses are the main SEE behaviors for UC1845 AJ. In addition, a new SEE behavior which manifests as changes in the duty cycles of many output pulses is revealed. This means that an SEE hardened design should be considered.
Zhao Wen,Guo Xiaoqiang,Chen Wei,Guo Hongxia,Lin Dongsheng,Wang Hanning,Luo Yinhong,Ding Lili,Wang Yuanming（1. State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi＇ an 710024, China; 2.Beijing Microelectronics Technology Institute, Beijing 100076, China）
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ISSN:1674-4926
DOI:10.1088/1674-4926/36/11/115008