Quantitative Study of Pulsed X-Ray-Induced Electromagnetic Response in Coaxial Cables

This article aims to quantify the radiation-induced electric responses of coaxial cables while irradiated by a pulsed X-ray flux. First, a precise characterization of the X-ray generator was performed using the 3-D Maxwell and Monte Carlo numerical simulations. These results were used to calculate t...

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 67; no. 7; pp. 1722 - 1731
Main Authors Ribiere, M., de Dortan, F. de Gaufridy, Delaunay, R., Aubert, D., Gouriou, T., Maisonny, R., d'Almeida, T.
Format Journal Article
LanguageEnglish
Published New York IEEE 01.07.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Cables
Coaxial cables
Computer simulation
Conduction
Conductivity
Conductors
Current measurement
Dielectrics
Dosage
Electric cables
Maxwell calculations
Monte Carlo calculations
Photoelectric effect
Photoelectric emission
Photonics
Power cables
Radiation
Radiation effects
Ray generators
system-generated electromagnetic pulse (SGEMP)
transient radiation effects on electronics
Voltage measurement
X-rays
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Summary:This article aims to quantify the radiation-induced electric responses of coaxial cables while irradiated by a pulsed X-ray flux. First, a precise characterization of the X-ray generator was performed using the 3-D Maxwell and Monte Carlo numerical simulations. These results were used to calculate the currents induced by the X-rays within the cables by using the 3-D Monte Carlo and 2-D transverse electromagnetic numerical codes. A systematic analysis of the responses of several cable references was performed by comparing the experimental and numerical results. This allows for the determination of gaps at the interface between the cable dielectrics and conductors. From these results, a parametric numerical extrapolation at high X-ray fluences was performed. It is shown that the system-generated electromagnetic pulse (SGEMP) responses are governed by photocurrents in gaps below 10 11 rad/s, while for greater dose rates, conduction currents in the dielectrics govern the responses. The approach developed in this article is useful for investigating electrical responses of systems subjected to highly ionizing environment, which is of paramount importance for addressing hardening issues.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2020.2978226