Fabrication of porous disk-like Ni/NiO microwave absorber and its excellent broad frequency absorption performance

This research reports a novel porous disk-like Ni/NiO binary composite with the diameter of disk ranged in 100–200 nm and the size of the porous distributed in 5–10 nm. The absence of Ni was generated by the partial reduction of NiO. This porous Ni/NiO product owns the matched impedance matching and...

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Bibliographic Details
Published inJournal of alloys and compounds Vol. 731; pp. 143 - 149
Main Authors Guo, Yuhang, Dong, Songtao, Liu, Suwei, Cheng, Ye, Zhang, Zhenya, Wang, Hongying
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier B.V 15.01.2018
Elsevier BV
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Summary:This research reports a novel porous disk-like Ni/NiO binary composite with the diameter of disk ranged in 100–200 nm and the size of the porous distributed in 5–10 nm. The absence of Ni was generated by the partial reduction of NiO. This porous Ni/NiO product owns the matched impedance matching and attenuation electromagnetic wave ability since the moderate complexed permittivity and improved permeability value. In this regard, this composite proves to be desired electromagnetic absorber to treat the increasingly electromagnetic interference issue (EMI). The qualified absorption frequency bandwidth of the optimal Ni/NiO product covers 6.4 GHz (11.2–17.6 GHz) under the coating layer thickness of 1.5 mm. The excellent electromagnetic absorption properties have been discussed in depth. The unique porous structure benefits to the electromagnetic absorption performance which is due to the suppressed eddy current effect. •The porous disk-like structure is able to suppress the unwanted eddy current effect.•The partial reduction of NiO benefits to the impedance matching and attenuation electromagnetic ability.•The electromagnetic absorption performance was tunable by adjusting the reduction degree.•The optimal qualified absorption frequency bandwidth could up to 6.2 GHz while the thickness was only 1.5 mm.
ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2017.09.226