An overview of radiation effects on electronic devices under severe accident conditions in NPPs, rad-hardened design techniques and simulation tools

• Published in: Progress in nuclear energy (New series) Vol. 114; pp. 105 - 120
• Main Authors: Huang, Qiang, Jiang, Jin
• Format: Journal Article
• Language: English
• Published: Oxford Elsevier Ltd 01.07.2019; Elsevier BV
• Subjects: Accident conditions; Computer simulation; Electronic devices; Electronics; Modern electronic system; Nuclear power plant; Nuclear power plants; Radiation; Radiation effects; Radiation-hardened techniques; Scattering; Severe accident; Simulation; Radiation effects; Modern electronic system; Radiation-hardened techniques; Severe accident; Nuclear power plant
• ISSN: 0149-1970; 1878-4224
• DOI: 10.1016/j.pnucene.2019.02.008

New requirements on post-accident monitoring systems in nuclear power plants pose fresh challenges for electronic system designers and nuclear power plant personnel, in particular, on how radiation can potentially affect the electronics in such systems; and how one can deal with such effects. In fact, study on radiation effects on electronic devices, effective design techniques to reduce such impacts, as well as simulation tools and design aids, has spanned for many decades. As a result, there is vast literature on the subject scattered in many places and in various forms, which inadvertently makes it difficult for non-specialists, such as an electronic engineer, to obtain relevant information effectively. The objective of the current paper is to provide a high-level overview in an organized fashion to guide readers to right literature for more detailed study on a specific topic in this area. The paper consists of three logically connected parts: radiation effects on electronics; design techniques to minimize such effects; and modeling and simulation tools available. For each part, a brief introduction of key issues is described first followed by a list of key references. In total, 336 references have been assembled to provide a comprehensive coverage on this subject. •Overview of radiation effects on electronic devices under severe accident conditions in NPPs.•Overview of rad-hardened design techniques and simulation tools.•In total, 336 references have been assembled.•References have been categorized logically for easy search.