Preparation and investigation of epoxy/Li0.5AlxFe2.5-xO4 nanocomposites for electronic packaging applications
In recent years, there has been a growing demand for polymer-based multifunctional materials for electronic packaging applications. For this purpose, epoxy/Li0.5AlxFe2.5-xO4 (95:5 wt%) nanocomposite samples have been prepared, where (x = 0, 0.15, 0.25, 0.35, and 0.45). The interface region between t...
Saved in:
Published in | Journal of alloys and compounds Vol. 821; p. 153533 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Lausanne
Elsevier B.V
25.04.2020
Elsevier BV |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | In recent years, there has been a growing demand for polymer-based multifunctional materials for electronic packaging applications. For this purpose, epoxy/Li0.5AlxFe2.5-xO4 (95:5 wt%) nanocomposite samples have been prepared, where (x = 0, 0.15, 0.25, 0.35, and 0.45). The interface region between the epoxy and the inserted nanoferrite fillers plays a significant role in the interpretation of the properties of the nanocomposite samples according to the dual interface nanolayer model. The magnetic properties (Ms, Mr, Hc) of the composite samples extracted from the M-H hysteresis loops, change with increasing Al3+ ions content following the same trend as their corresponding pure ferrites counterparts, but with lower values as expected. Whereas, the dielectric properties (σʹac, εʹ, and tanδ) almost increase. The dielectric strength and energy density are evaluated for the nanocomposite samples by using sphere to plane electrode configuration. The results of εʹ, tanδ, dielectric strength, energy density and the good magnetic properties of the composite samples, indicate that they are promising candidates for electronic packaging applications as well as can serve as a typical EMI suppressor.
The Cole-Cole (Zʹ-Zʺ) plots for the EPX/LAF nanocomposites. [Display omitted]
•Different compositions of 5 wt% of Al–Li ferrites were dispersed in epoxy matrix.•Ms, Mr, Hc, Sq, and Ls of EPX/LAF almost decrease with increasing Al3+ ions.•Composition dependence of the σac’, εʹ, and εʹʹ was discussed depending on the DINM.•Dominant relaxation process in the samples is interfacial polarization: MWS effect.•The samples are represented by two parallel R–C equivalent circuits in series. |
---|---|
ISSN: | 0925-8388 1873-4669 |
DOI: | 10.1016/j.jallcom.2019.153533 |