Resonantly enhanced production of excited fragments of gaseous molecules following core-level excitation

• Published in: Journal of electron spectroscopy and related phenomena Vol. 144; no. Complete; pp. 171 - 174
• Main Authors: Chen, J.M., Lu, K.T., Lee, J.M., Ho, S.C., Chang, H.W., Lee, Y.Y.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.06.2005
• Subjects: Dispersed fluorescence spectrum; Resonant photoemission; X-ray absorption; Resonant photoemission; X-ray absorption; Dispersed fluorescence spectrum
• ISSN: 0368-2048; 1873-2526
• DOI: 10.1016/j.elspec.2005.01.112

State-selective dissociation dynamics for the excited fragments of gaseous Si(CH 3) 2Cl 2 following Cl 2p and Si 2p core-level excitations have been investigated by resonant photoemission spectroscopy and dispersed UV/optical fluorescence spectroscopy. The main features in the gaseous Si(CH 3) 2Cl 2 fluorescence spectrum are identified as the emission from excited Si*, Si +*, CH* and H*. The core-to-Rydberg excitations at both Si 2p and Cl 2p edges lead to a noteworthy production of not only the excited atomic fragments, neutral and ionic (Si*, Si +*) but also the excited diatomic fragments (CH*). In particular, the excited neutral atomic fragments Si* are significantly reinforced. The experimental results provide deeper insight into the state-selective dissociation dynamics for the excited fragments of molecules via core-level excitation.