Spherical near-field facility for microwave coupling assessments in the 100 MHz-6 GHz frequency range

• Published in: IEEE transactions on electromagnetic compatibility Vol. 40; no. 3; pp. 225 - 234
• Main Authors: Serafin, D., Lasserre, J.-L., Bolomey, J., Cottard, G., Garreau, P., Lucas, F., Therond, F.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.08.1998; Institute of Electrical and Electronics Engineers
• Subjects: Antenna measurements; Applied sciences; Carbon capture and storage; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic measurements; Electronics; Exact sciences and technology; Frequency; Impedance; Noise measurement; Numerical models; Testing; Testing, measurement, noise and reliability; Near field; Complex system; Measuring system; Microwave; Electromagnetic compatibility; Numerical simulation; Spherical model; Low power; Electromagnetic wave; Electromagnetic coupling
• ISSN: 0018-9375; 1558-187X
• DOI: 10.1109/15.709420

This paper describes a spherical near-field facility set up at the Centre d'Etudes de Gramat (CEG) to perform low-power microwave coupling assessments. Specifically, this facility has been designed to determine the coupling cross section of a complex object. However, it can also be used for the characterization of any radiating system in electromagnetic compatibility (EMC) or high-power microwave (HPM) environments. The near-field approach is shown to be complementary and to offer increased flexibility when compared to other more conventional measurement techniques. More particularly, the use of a probe array in the upper part of the frequency band significantly speeds up the near-field measurement process. Consequently, broadband and multiparameter acquisitions can be performed within acceptable duration. The examples given in this paper provide a broad illustration of the capabilities of near-field techniques for EMC and HPM applications.