Laser ablation of CsI analyzed by delayed extraction

Secondary ion emission from polycrystalline CsI irradiated by pulsed-UV laser (337 nm) is analyzed by time-of-flight (TOF) mass spectrometry. Measurements were performed for different laser intensities and for several delayed extraction times (0–200 ns). The TOF peak shape is characterized by a Gaus...

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Published inApplied surface science Vol. 217; no. 1; pp. 202 - 209
Main Authors Fernández-Lima, F, Collado, V.M, Ponciano, C.R, Farenzena, L.S, Pedrero, E, da Silveira, E.F
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 15.07.2003
Elsevier Science
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Summary:Secondary ion emission from polycrystalline CsI irradiated by pulsed-UV laser (337 nm) is analyzed by time-of-flight (TOF) mass spectrometry. Measurements were performed for different laser intensities and for several delayed extraction times (0–200 ns). The TOF peak shape is characterized by a Gaussian-like structure (fast component), followed by a tail (slow component) that is more pronounced when the extraction field is delayed. A thermal-sputtering uni-dimensional model is employed to describe the solid surface and plasma temperatures as a function of time. Heat diffusion, vapor photo-ionization, radiative emission and plume expansion are considered. Within the approximations used, the model predicts reasonable drift velocities of the plume (≈1.4 km s −1) but very high plasma temperatures (≈10 5 K). The width of the TOF peak fast component allows determination of the plume temperature during its expansion.
ISSN:0169-4332
1873-5584
DOI:10.1016/S0169-4332(03)00547-6