Laser ablation of CsI analyzed by delayed extraction
Secondary ion emission from polycrystalline CsI irradiated by pulsed-UV laser (337 nm) is analyzed by time-of-flight (TOF) mass spectrometry. Measurements were performed for different laser intensities and for several delayed extraction times (0–200 ns). The TOF peak shape is characterized by a Gaus...
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Published in | Applied surface science Vol. 217; no. 1; pp. 202 - 209 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
15.07.2003
Elsevier Science |
Subjects | |
Online Access | Get full text |
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Summary: | Secondary ion emission from polycrystalline CsI irradiated by pulsed-UV laser (337
nm) is analyzed by time-of-flight (TOF) mass spectrometry. Measurements were performed for different laser intensities and for several delayed extraction times (0–200
ns). The TOF peak shape is characterized by a Gaussian-like structure (fast component), followed by a tail (slow component) that is more pronounced when the extraction field is delayed. A thermal-sputtering uni-dimensional model is employed to describe the solid surface and plasma temperatures as a function of time. Heat diffusion, vapor photo-ionization, radiative emission and plume expansion are considered. Within the approximations used, the model predicts reasonable drift velocities of the plume (≈1.4
km
s
−1) but very high plasma temperatures (≈10
5
K). The width of the TOF peak fast component allows determination of the plume temperature during its expansion. |
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ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/S0169-4332(03)00547-6 |