Enhancement of the thermoelectric properties in β-Cu2+xSe/a-C nano-multilayer films by heterogeneous interfaces

The β-Cu2+xSe/a-C nano-multilayer films were prepared. The carrier concentration, mobility and thermal conductivity decrease and the resistivity and Seebeck coefficient increase with reducing the modulation periods. For the β-Cu2+xSe/a-C nano-multilayer film with the lowest modulation period 160 nm,...

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Published inJournal of alloys and compounds Vol. 930; p. 167432
Main Authors Li, Guipeng, Song, Guihong, Wang, Nan, Wu, Yusheng, Du, Hao, You, Junhua, Zhang, Hangzhou
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier B.V 05.01.2023
Elsevier BV
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ISSN0925-8388
1873-4669
DOI10.1016/j.jallcom.2022.167432

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Summary:The β-Cu2+xSe/a-C nano-multilayer films were prepared. The carrier concentration, mobility and thermal conductivity decrease and the resistivity and Seebeck coefficient increase with reducing the modulation periods. For the β-Cu2+xSe/a-C nano-multilayer film with the lowest modulation period 160 nm, the power factor and ZT value reach 0.57 mW·m−1·K−2 and 0.42 at room temperature, respectively. Enhanced power factor and ZT values in the nano-multilayer films are attributed to scattering effect of the depletion layer at the β-Cu2+xSe/a-C interface that decreases the carrier concentration and mobility. The existence of the heterogeneous interface effectively increases the Seebeck coefficient and decreases thermal conductivity due to increasing the scattering effect of carriers and phonons. The introduction of a-C layer with high electric conduction into β-Cu2+xSe to form β-Cu2+xSe/a-C nano-multilayer film can effectively improve its thermoelectric properties. •β-Cu2−xSe/a-C nano-multilayer films with different modulation period were prepared.•The carrier concentration and mobility decrease with reducing modulation periods.•The layer interface shows an obvious scattering effect on carriers and phonons.•The Seebeck coefficient and ZT greatly increases with reducing modulation period.
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ISSN:0925-8388
1873-4669
DOI:10.1016/j.jallcom.2022.167432