Studies on electrodeposited silver sulphide thin films by double exposure holographic interferometry

• Published in: Applied surface science Vol. 255; no. 5; pp. 1819 - 1823
• Main Authors: Prabhune, V.B., Shinde, N.S., Fulari, V.J.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 30.12.2008
• Subjects: Double exposure holographic interferometry (DEHI) technique; Electrodeposition; Optical absorption; Silver sulphide; X-ray diffraction; X-ray diffraction; Electrodeposition; Silver sulphide; Double exposure holographic interferometry (DEHI) technique; Optical absorption
• ISSN: 0169-4332; 1873-5584
• DOI: 10.1016/j.apsusc.2008.06.022

Silver sulphide (Ag 2S) thin films have been deposited on to stainless steel and fluorine doped tin oxide (FTO) glass substrates by the electrodeposition process, in potentiostatic mode using silver nitrate (AgNO 3), sodium thiosulphate (Na 2S 2O 3) as a precursor sources and Ethylene Diamine Tetra Acetic Acid (EDTA) was used as a complexing agent. The deposition potential of the compound was investigated by cyclic voltammetry. The structural and optical properties of the deposited films have been studied using X-ray diffraction (XRD) and optical absorption techniques, respectively. XRD studies reveal that the films are polycrystalline with monoclinic crystal structure. Optical absorption study shows the presence of direct transition with bandgap energy 1.1 eV. The determination of thickness and stress of the Ag 2S thin films was carried out by Double Exposure Holographic Interferometry (DEHI) technique.