Optical investigations of the CdTeSe and CdMeTeSe (Me=Mn, Fe) semiconductors

• Published in: Journal of alloys and compounds Vol. 335; no. 1; pp. 35 - 42
• Main Authors: Pukowska, B, Jaglarz, J, Such, B, Wagner, T, Kisiel, A, Mycielski, A
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 14.03.2002; Elsevier
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; Light absorption and reflection; Metals, semimetals, and alloys; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Physics; Semiconductors; Surfaces and interfaces; Visible and ultraviolet spectra; Semiconductors; Surfaces and interfaces; Light absorption and reflection; Quaternary alloys; Temperature dependence; Atomic force microscopy; Inorganic compounds; Semiconductor materials; Spectroscopic ellipsometry; Manganese tellurides; Energy spectra; Ternary compounds; Transition element compounds; Cadmium selenides; Reflection spectrum; Cadmium tellurides; Angular variation; Absorption spectra; Reliability; Quaternary compounds; Reflectance
• ISSN: 0925-8388; 1873-4669
• DOI: 10.1016/S0925-8388(01)01850-3

Reflectivity measurements have been performed for ternary semiconducting compounds CdTe 1− x Se x ( x=0.1, 0.15, 0.20) and quaternary compounds Cd 1− y Mn y Te 1− x Se x ( x=0.1, 0.2; y=0.05, 0.1) and Cd 1− k Fe k Te 1− x Se x ( k=0.02, x=0.006, 0.1, 0.2) in the 0.5–5.9 eV energy range at room temperature. In the reflectivity spectra, in this energy range, three distinct maxima were observed which according to Cardona’s notation are known as E 1, E 1+Δ 1 and E 2. For all samples it was observed that increasing the Se content results in a decrease in the intensity of reflectivity spectra and in the blurring of the spectrum structure. The spectral dependencies of optical parameters (reflection, absorption, refraction coeff.) have also been determined for quaternary Cd MeTeSe alloys (Me=Mn, Fe) by Variable Angle Spectroscopic Ellipsometry (VASE) and the surfaces of the samples have been scanned by Atomic Force Microscopy (AFM). Reflectivity data give comparable and even more reliable results than ellipsometry based on measurements of angles Ψ and Δ. The influences of Mn and Fe on CdTe and CdSe base alloys are discussed.