Fringing field correction of the second-order angular aberration in sector field electron energy analyzers

A new way of correcting the second-order angular aberration in sector field and polar-toroidal electron energy analyzers with object and image located outside the field is proposed. Correction is performed by biasing the optic axis electrostatic potential inside the analyzer with respect to the pote...

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Bibliographic Details
Published inJournal of electron spectroscopy and related phenomena Vol. 168; no. 1; pp. 29 - 33
Main Authors Yavor, M.I., Belov, V.D., Pomozov, T.V.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.12.2008
Subjects
Aberration
Electron optics
Energy analyzer
Fringing field
Second-order focusing
Sector field
Energy analyzer
Electron optics
Second-order focusing
Aberration
Fringing field
Sector field
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Summary:A new way of correcting the second-order angular aberration in sector field and polar-toroidal electron energy analyzers with object and image located outside the field is proposed. Correction is performed by biasing the optic axis electrostatic potential inside the analyzer with respect to the potential of surrounding field-free space. The strength of the correcting aberration concentrated in the fringing field regions of the analyzer is calculated with the aid of the fringing field integral method. The described correction allows achieving second-order focusing and thus increasing the energy resolving power in sector field analyzers, in particular used for angle resolved energy measurements.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0368-2048
1873-2526
DOI:10.1016/j.elspec.2008.08.005