Surface polarity dependence of decomposition and growth of GaN studied using in situ gravimetric monitoring
The influence of lattice polarity of wurzite GaN(0 0 0 1) on its decomposition rate was investigated using an in situ gravimetric monitoring (GM) method with freestanding GaN(0 0 0 1) substrates. At temperatures between 800°C and 850°C, the decomposition rate of GaN(0 0 0 1) was faster than that of...
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Published in | Journal of crystal growth Vol. 246; no. 3; pp. 230 - 236 |
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Main Authors | , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.12.2002
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | The influence of lattice polarity of wurzite GaN(0
0
0
1) on its decomposition rate was investigated using an in situ gravimetric monitoring (GM) method with freestanding GaN(0
0
0
1) substrates. At temperatures between 800°C and 850°C, the decomposition rate of GaN(0
0
0
1) was faster than that of GaN(
0
0
0
1
̄
). On the other hand, the decomposition rate of GaN(
0
0
0
1
̄
) was faster than that of GaN(0
0
0
1) at temperatures between 900°C and 950°C. The relation between the decomposition rate and the H
2 partial pressure (
P
H
2
) indicates that the rate-limiting reactions are N(surface)+
3
2
H
2(g)→NH
3(g) at lower temperatures, but Ga(surface)+
1
2
H
2(g)→GaH(g) at higher temperatures. In addition, we used the GM method to measure the growth rate of GaN(0
0
0
1) on freestanding GaN(0
0
0
1) substrates. In the low-temperature region, GaN(
0
0
0
1
̄
) grew faster than GaN(0
0
0
1), whereas GaN(0
0
0
1) grew faster than GaN(
0
0
0
1
̄
) in the high-temperature region. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/S0022-0248(02)01746-3 |