Surface polarity dependence of decomposition and growth of GaN studied using in situ gravimetric monitoring

The influence of lattice polarity of wurzite GaN(0 0 0 1) on its decomposition rate was investigated using an in situ gravimetric monitoring (GM) method with freestanding GaN(0 0 0 1) substrates. At temperatures between 800°C and 850°C, the decomposition rate of GaN(0 0 0 1) was faster than that of...

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Bibliographic Details
Published inJournal of crystal growth Vol. 246; no. 3; pp. 230 - 236
Main Authors Koukitu, Akinori, Mayumi, Miho, Kumagai, Yoshinao
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 01.12.2002
Elsevier
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Summary:The influence of lattice polarity of wurzite GaN(0 0 0 1) on its decomposition rate was investigated using an in situ gravimetric monitoring (GM) method with freestanding GaN(0 0 0 1) substrates. At temperatures between 800°C and 850°C, the decomposition rate of GaN(0 0 0 1) was faster than that of GaN( 0 0 0 1 ̄ ). On the other hand, the decomposition rate of GaN( 0 0 0 1 ̄ ) was faster than that of GaN(0 0 0 1) at temperatures between 900°C and 950°C. The relation between the decomposition rate and the H 2 partial pressure ( P H 2 ) indicates that the rate-limiting reactions are N(surface)+ 3 2 H 2(g)→NH 3(g) at lower temperatures, but Ga(surface)+ 1 2 H 2(g)→GaH(g) at higher temperatures. In addition, we used the GM method to measure the growth rate of GaN(0 0 0 1) on freestanding GaN(0 0 0 1) substrates. In the low-temperature region, GaN( 0 0 0 1 ̄ ) grew faster than GaN(0 0 0 1), whereas GaN(0 0 0 1) grew faster than GaN( 0 0 0 1 ̄ ) in the high-temperature region.
ISSN:0022-0248
1873-5002
DOI:10.1016/S0022-0248(02)01746-3