Spatial characterization of fiber Bragg grating structures using transversal pressure

A technique for low cost and high precision characterization of fiber Bragg gratings based structures, using transversal pressure, is presented. It is based on the analysis of the amplitude and wavelength changes of the structure reflection spectrum, while being precisely pressed by an electromechan...

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Bibliographic Details
Published inOptics communications Vol. 259; no. 1; pp. 110 - 114
Main Authors Nogueira, R.N., Abe, I., Fernandes, A.J., Kalinowski, H.J., da Rocha, J.R.F., Pinto, J.L
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.03.2006
Elsevier Science
Subjects
Applied sciences
Circuit properties
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Gratings
Integrated optics. Optical fibers and wave guides
Optical and optoelectronic circuits
Optical elements, devices, and systems
Optics
Physics
Diffraction grating
Optical telecommunication
Theoretical study
Bragg grating
Optical communication systems
Experimental device
Cavity resonator
Grating in fiber
Optical fiber
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Summary:A technique for low cost and high precision characterization of fiber Bragg gratings based structures, using transversal pressure, is presented. It is based on the analysis of the amplitude and wavelength changes of the structure reflection spectrum, while being precisely pressed by an electromechanically actuated arm. The theory and the experimental results, which are in good agreement with the expected ones, are also presented.
ISSN:0030-4018
1873-0310
DOI:10.1016/j.optcom.2005.08.033