Image contrast enhancement algorithm for X-ray observation of space materials in situ
Abstract Chinese Space Station has planned a high-temperature material science experiment rack, equipped with an X-ray projection imaging module, to support the development of material experiments and research in space. BiFeO3 has been selected as the first batch of experimental materials for Chines...
Saved in:
Published in | Journal of instrumentation Vol. 17; no. 6; p. P06010 |
---|---|
Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Bristol
IOP Publishing
01.06.2022
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Abstract
Chinese Space Station has planned a high-temperature
material science experiment rack, equipped with an X-ray projection
imaging module, to support the development of material experiments
and research in space. BiFeO3 has been selected as the first batch
of experimental materials for Chinese Space Station. The melting and
solidification process of BiFeO
3
, an opaque, high-temperature
material, is observed by X-ray observation module in situ. X-ray is
the dominant way to observe opaque materials due to its
penetrability. In-situ observation of materials is the top priority
of this study, so we have strict requirements on image quality, and
high-quality images can better analyze the properties and properties
of materials. Limited by narrow size and high temperature
conditions, the X-ray images collected have low contrast, serious
noise pollution, and poor imaging quality. To enhance the contrast
and improve the edge details of such images, a grayscale weighted
histogram equalization combined with high-frequency enhancement
(GWHE-HFE) algorithm is proposed. First, we add a mask to the input
image to obtain the region of interest (ROI), and then filter out
the low-frequency components of the image by Gaussian high-pass
filter to preserve high-frequency details. Second, the image
obtained in the previous and the X-ray image of ROI are respectively
multiplied by a coefficient and added to obtain the edge-emphasized
X-ray image. And then, we use grayscale weighted histogram
equalization (GWHE) to process the image obtained in the second step
to obtain the contrast enhanced X-ray image. The enhanced image
shows the crystal grains and the thin bands where the solid and the
melt intersect, and it is helpful to accurately locate the solid
solution interface. Experiments on X-ray images of BiFeO3 growth
demonstrate that this combined method outperforms existing ones both
qualitatively and quantitatively, providing an in-depth and
effective analysis method for in high-temperature material-science
experiments. |
---|---|
ISSN: | 1748-0221 1748-0221 |
DOI: | 10.1088/1748-0221/17/06/P06010 |