Morphology of homo-epitaxial vicinal (1 0 0) III–V surfaces
Vicinal substrates are widely used to fabricate semiconductor devices. The different surface step types and their density have a strong influence on the surface structure. We have systematically studied this misorientation dependence on the morphology of (1 0 0)InP as a function of growth conditions...
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Published in | Journal of crystal growth Vol. 200; no. 1; pp. 19 - 31 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.04.1999
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | Vicinal substrates are widely used to fabricate semiconductor devices. The different surface step types and their density have a strong influence on the surface structure. We have systematically studied this misorientation dependence on the morphology of (1
0
0)InP as a function of growth conditions in chemical beam epitaxy. On substrates containing no steps or only A-type steps we observe mirror-like surfaces, but many characteristic defects are always present. The defect density is successfully reduced by the introduction of B-type steps. When a sufficient density of only B steps is present, the surface is very smooth with almost no defects. Near any B “step up” edge, however, a ripple pattern is formed, which extends over tens of microns in the B step propagation direction. For substrates with mixed steps the ripple pattern is more pronounced and significant surface roughening occurs. Here, we present and discuss a general model for the morphology of (2×4) reconstructed vicinal (1
0
0) III–V surfaces. It gives a complete and quantitative description of these observations, including the dependence on growth conditions and thus provides a useful tool to study and optimize the growth process. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/S0022-0248(98)01412-2 |