Theoretical and experimental investigation of the force–distance relation for an atomic force microscope with a pyramidal tip

• Published in: Surface science Vol. 453; no. 1; pp. 75 - 82
• Main Authors: Zanette, S.I., Caride, A.O., Nunes, V.B., Klimchitskaya, G.L., Freire, F.L., Prioli, R.
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier B.V 10.05.2000; Amsterdam Elsevier Science; New York, NY
• Subjects: Atomic force microscopy; Atom–solid interactions; Condensed matter: structure, mechanical and thermal properties; Electron, ion, and scanning probe microscopy; Exact sciences and technology; Physics; Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc; Solid-fluid interfaces; Structure of solids and liquids; crystallography; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Atomic force microscopy; Atom–solid interactions; Theoretical study; Tip surface interactions; Microscope tips; Experimental study; Van der Waals forces
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/S0039-6028(00)00306-X

The van der Waals force is calculated between the atomic force microscope tip modelled by a truncated pyramid with a spherical apex and a plane plate. The force–distance relation obtained is verified experimentally. Microscopic images of the tip in use show the good agreement with the proposed theoretical model. The root mean square deviation between the calculated and observed forces is less than 10% at the smallest tip–sample distance.