Strain relaxation in thin films of Cu grown on Ni(0 0 1)
Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1 1 1) facets formed in thin Cu films when grown on Ni(0 0 1). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni in...
Saved in:
Published in | Physica. B, Condensed matter Vol. 248; no. 1; pp. 34 - 38 |
---|---|
Main Authors | , , , , |
Format | Journal Article Conference Proceeding |
Language | English |
Published |
Amsterdam
Elsevier B.V
01.06.1998
Elsevier |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1
1
1) facets formed in thin Cu films when grown on Ni(0
0
1). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. |
---|---|
AbstractList | Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1
1
1) facets formed in thin Cu films when grown on Ni(0
0
1). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. |
Author | Johnson, Robert L. Baker, Jeff Feidenhans'l, Robert Nielsen, Mourits Berg Rasmussen, Frank |
Author_xml | – sequence: 1 givenname: Frank surname: Berg Rasmussen fullname: Berg Rasmussen, Frank organization: Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark – sequence: 2 givenname: Jeff surname: Baker fullname: Baker, Jeff organization: Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark – sequence: 3 givenname: Mourits surname: Nielsen fullname: Nielsen, Mourits organization: Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark – sequence: 4 givenname: Robert surname: Feidenhans'l fullname: Feidenhans'l, Robert organization: Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark – sequence: 5 givenname: Robert L. surname: Johnson fullname: Johnson, Robert L. organization: II Institut für Experimentalphysik, Universität Hamburg, Luruper Chausee 149, D-22761, Germany |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2374016$$DView record in Pascal Francis |
BookMark | eNqFj01LAzEQhoNUsK3-BCEHD-1hNZM0m-QkUuoHFD1UzyGbTTSy3S3J-vXvTVvp1TnMMMz7zsszQoO2ax1C50AugUB5tSKKQjHjtJwoOSUElCrUERqCFKygwPgADQ-SEzRK6Z3kAgFDJFd9NKHF0TXm2_Sha3He-rfcfGjWCXcezz_wa-y-WpyPj2FCMMEwPUXH3jTJnf3NMXq5XTzP74vl093D_GZZWMbKvjDKALeWCGG94NzLsvZMzhTxUINkXClLJfXEckfrqmIKPGWiqgWnoiorzsaI7__a2KUUndebGNYm_mggeouvd_h6y6aV1Dt8rbLvYu_bmGRN46NpbUgHcw6ZZXOWXe9lLjN8Bhd1ssG11tUhOtvrugv_BP0CfMFtkw |
CitedBy_id | crossref_primary_10_1142_S0218625X01000859 |
Cites_doi | 10.1103/PhysRevLett.76.2358 10.1103/PhysRevLett.79.4413 10.1103/PhysRevLett.77.2009 10.1107/S0021889893004364 10.1103/PhysRevB.33.3830 |
ContentType | Journal Article Conference Proceeding |
Copyright | 1998 Elsevier Science B.V. 1998 INIST-CNRS |
Copyright_xml | – notice: 1998 Elsevier Science B.V. – notice: 1998 INIST-CNRS |
DBID | IQODW AAYXX CITATION |
DOI | 10.1016/S0921-4526(98)00199-9 |
DatabaseName | Pascal-Francis CrossRef |
DatabaseTitle | CrossRef |
DatabaseTitleList | |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Physics |
EISSN | 1873-2135 |
EndPage | 38 |
ExternalDocumentID | 10_1016_S0921_4526_98_00199_9 2374016 S0921452698001999 |
GrantInformation_xml | – fundername: Rutherford Appleton Laboratory – fundername: Daresbury Laboratory |
GroupedDBID | --K --M -~X .~1 0R~ 123 1B1 1RT 1~. 1~5 29O 4.4 457 4G. 5VS 6TJ 7-5 71M 8P~ 9JN AABNK AACTN AAEDT AAEDW AAEPC AAIAV AAIKJ AAKOC AALRI AAOAW AAQFI AAQXK AAXUO ABFNM ABMAC ABNEU ABXDB ABXRA ABYKQ ACDAQ ACFVG ACGFS ACNCT ACNNM ACRLP ADBBV ADEZE ADIYS ADMUD AEBSH AEKER AFFNX AFKWA AFTJW AGHFR AGUBO AGYEJ AHHHB AIEXJ AIKHN AITUG AIVDX AJBFU AJOXV ALMA_UNASSIGNED_HOLDINGS AMFUW AMRAJ ASPBG AVWKF AXJTR AZFZN BBWZM BKOJK BLXMC CS3 EBS EFJIC EFLBG EJD EO8 EO9 EP2 EP3 FDB FEDTE FGOYB FIRID FNPLU FYGXN G-Q GBLVA HMV HVGLF HZ~ H~9 IHE J1W K-O KOM M38 M41 MAGPM MO0 MVM N9A NDZJH O-L O9- OAUVE OGIMB OZT P-8 P-9 P2P PC. Q38 R2- RIG RNS ROL RPZ SDF SDG SDP SES SEW SPC SPCBC SPD SPG SSQ SSZ T5K TN5 VOH WUQ XJT XOL XPP YNT ZMT ~02 ~G- 08R ABPIF ABPTK IQODW AAXKI AAYXX ADVLN AFJKZ CITATION |
ID | FETCH-LOGICAL-c336t-a9a15cc077cf755f86df38490f1d183599c282f0c5e2dbb391f237bd7527b6b53 |
IEDL.DBID | .~1 |
ISSN | 0921-4526 |
IngestDate | Thu Sep 26 16:31:54 EDT 2024 Sun Oct 22 16:05:00 EDT 2023 Fri Feb 23 02:28:56 EST 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 1 |
Keywords | X-ray diffraction Strain relaxation Nanoclusters Thin films Stress relaxation Transition elements XRD Copper Experimental study Lattice parameters |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MeetingName | SXNS-5 International Conference on Surface X-ray and Neutron Scattering |
MergedId | FETCHMERGED-LOGICAL-c336t-a9a15cc077cf755f86df38490f1d183599c282f0c5e2dbb391f237bd7527b6b53 |
PageCount | 5 |
ParticipantIDs | crossref_primary_10_1016_S0921_4526_98_00199_9 pascalfrancis_primary_2374016 elsevier_sciencedirect_doi_10_1016_S0921_4526_98_00199_9 |
PublicationCentury | 1900 |
PublicationDate | 1998-06-01 |
PublicationDateYYYYMMDD | 1998-06-01 |
PublicationDate_xml | – month: 06 year: 1998 text: 1998-06-01 day: 01 |
PublicationDecade | 1990 |
PublicationPlace | Amsterdam |
PublicationPlace_xml | – name: Amsterdam |
PublicationTitle | Physica. B, Condensed matter |
PublicationYear | 1998 |
Publisher | Elsevier B.V Elsevier |
Publisher_xml | – name: Elsevier B.V – name: Elsevier |
References | E. Vlieg to be published; C. Schamper, H.L. Meyerheim, W. Moritz, J. Appl. Crystallogr. 26 (1993) 687. Müller, Fischer, Nedelmann, Fricke, Kern (BIB1) 1996; 76 Robinson (BIB3) 1986; 33 Berg Rasmussen, Baker, Nielsen, Feidenhans'l, Johnson (BIB2) 1997; 79 Steinfort, Scholte, Ettema, Tuinstra, Nielsen, Landemark, Feidenhans'l, Falkenberg, Seehofer, Johnson (BIB4) 1996; 77 Müller (10.1016/S0921-4526(98)00199-9_BIB1) 1996; 76 Steinfort (10.1016/S0921-4526(98)00199-9_BIB4) 1996; 77 10.1016/S0921-4526(98)00199-9_BIB5 Robinson (10.1016/S0921-4526(98)00199-9_BIB3) 1986; 33 Berg Rasmussen (10.1016/S0921-4526(98)00199-9_BIB2) 1997; 79 |
References_xml | – volume: 79 start-page: 4413 year: 1997 ident: BIB2 publication-title: Phys. Rev. Lett. contributor: fullname: Johnson – volume: 33 start-page: 3830 year: 1986 ident: BIB3 publication-title: Phys. Rev. B contributor: fullname: Robinson – volume: 76 start-page: 2358 year: 1996 ident: BIB1 publication-title: Phys. Rev. Lett. contributor: fullname: Kern – volume: 77 start-page: 2009 year: 1996 ident: BIB4 publication-title: Phys. Rev. Lett. contributor: fullname: Johnson – volume: 76 start-page: 2358 year: 1996 ident: 10.1016/S0921-4526(98)00199-9_BIB1 publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.76.2358 contributor: fullname: Müller – volume: 79 start-page: 4413 year: 1997 ident: 10.1016/S0921-4526(98)00199-9_BIB2 publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.79.4413 contributor: fullname: Berg Rasmussen – volume: 77 start-page: 2009 year: 1996 ident: 10.1016/S0921-4526(98)00199-9_BIB4 publication-title: Phys. Rev. Lett. doi: 10.1103/PhysRevLett.77.2009 contributor: fullname: Steinfort – ident: 10.1016/S0921-4526(98)00199-9_BIB5 doi: 10.1107/S0021889893004364 – volume: 33 start-page: 3830 year: 1986 ident: 10.1016/S0921-4526(98)00199-9_BIB3 publication-title: Phys. Rev. B doi: 10.1103/PhysRevB.33.3830 contributor: fullname: Robinson |
SSID | ssj0000171 |
Score | 1.552592 |
Snippet | Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1
1
1) facets formed... |
SourceID | crossref pascalfrancis elsevier |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 34 |
SubjectTerms | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Mechanical and acoustical properties Nanoclusters Physical properties of thin films, nonelectronic Physics Strain relaxation Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) X-ray diffraction |
Title | Strain relaxation in thin films of Cu grown on Ni(0 0 1) |
URI | https://dx.doi.org/10.1016/S0921-4526(98)00199-9 |
Volume | 248 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3PT8IwFG4IxkRjjKJGVEgPHuBQ2A_atUdCJKiRC5Jwa2i36hIFIiPx5N_uazcEDsbEw5ase-2ab93re13f9xC6BZuVW-eYUBUlxPJMEjg0UQyM7Y7mgic2UPhpyAbjzsOETkqot46FsdsqC92f63SnrYuSdoFme5Gm7ZEnLMt2wAS3doqwQXyWbAvGdOvL36KQck6XFSZWehPFk7fgChuCN10jRPw2Px0tpktAzeTpLrbmoP4JOi6MR9zN-3eKSsmsgg63KAUraN9t6dTLM8RHLv0DttEqnw5_DFfZK5xM-va-xHODeyv8Yv1wDDeHacPDHvab52jcv3vuDUiRJ4HoMGQZmYqpT7X2IksxRKnhLDYh7wjP-DF8sVQIDY6V8TRNglipUPgmCCMVRzSIFFM0vEDl2XyWXCIc0tiDSjSJp_avr-ExA3meCKW5ESqsotYaHbnI6TDkZp8YwCktnFJw6eCUoor4GkO5814lqOy_qtZ2MP95IHQevEJ29f-mr9FBHltoV1NuUDn7WCU1MC4yVXejp472uvePg-E3y5rFfw |
link.rule.ids | 310,311,315,783,787,792,793,4511,23944,23945,24130,25154,27938,27939,45601,45695 |
linkProvider | Elsevier |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3dT8IwEL8gxqgxRlEjfvbBB3ioDEa33iMhElTgRUl4a2i36hJFIpj453vdhuCDMfFhS9b1bs2v2_Wuuw-AK9JZpTOOudBhzF2eSU6H4TogZbtpJMrYBQr3B0F32LwbiVEB2otYGOdWmcv-TKan0jpvqeVo1qZJUnvw0GXZbgQonZ6CuAbrpA2gKMJ66_a-O1jJIpXaXa4_dwTLQJ6MSdpYQVlN-XD8bYnamY5nBJzNKl6sLEOdPdjN9UfWyoa4D4V4UoLtlayCJdhIvTrN7ADkQ1oBgrmAlc90ChhdzZ_pZJOX1xl7s6z9wZ6cKc7o5iCpeMxj9eohDDs3j-0uz0slcOP7wZyPcVwXxnihyzIkhJVBZH3ZRM_WI_poBaIh28p6RsSNSGsf67bhhzoKRSPUgRb-ERQnb5P4GJgvIo-IRByN3Y9fK6OA-ssYtZEWtV-G6wU6applxFBLVzGCUzk4FUqVwqmwDHKBofoxtYqk9l-k5z8w_34gDZ4Mw-Dk_6wvYbP72O-p3u3g_hS2slBDt7lyBsX5-0d8TrrGXF_k79IX2DvIPg |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=proceeding&rft.title=Physica.+B%2C+Condensed+matter&rft.atitle=Strain+relaxation+in+thin+films+of+Cu+grown+on+Ni%280+0+1%29&rft.au=BERG+RASMUSSEN%2C+F&rft.au=BAKER%2C+J&rft.au=NIELSEN%2C+M&rft.au=FEIDENHANS%27L%2C+R&rft.date=1998-06-01&rft.pub=Elsevier&rft.issn=0921-4526&rft.eissn=1873-2135&rft.volume=248&rft.spage=34&rft.epage=38&rft_id=info:doi/10.1016%2FS0921-4526%2898%2900199-9&rft.externalDBID=n%2Fa&rft.externalDocID=2374016 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0921-4526&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0921-4526&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0921-4526&client=summon |