Strain relaxation in thin films of Cu grown on Ni(0 0 1)
Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1 1 1) facets formed in thin Cu films when grown on Ni(0 0 1). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni in...
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| Published in | Physica. B, Condensed matter Vol. 248; no. 1; pp. 34 - 38 |
|---|---|
| Main Authors | , , , , |
| Format | Journal Article Conference Proceeding |
| Language | English |
| Published |
Amsterdam
Elsevier B.V
01.06.1998
Elsevier |
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| Abstract | Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1
1
1) facets formed in thin Cu films when grown on Ni(0
0
1). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. |
|---|---|
| AbstractList | Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1
1
1) facets formed in thin Cu films when grown on Ni(0
0
1). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface. |
| Author | Johnson, Robert L. Baker, Jeff Feidenhans'l, Robert Nielsen, Mourits Berg Rasmussen, Frank |
| Author_xml | – sequence: 1 givenname: Frank surname: Berg Rasmussen fullname: Berg Rasmussen, Frank organization: Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark – sequence: 2 givenname: Jeff surname: Baker fullname: Baker, Jeff organization: Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark – sequence: 3 givenname: Mourits surname: Nielsen fullname: Nielsen, Mourits organization: Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark – sequence: 4 givenname: Robert surname: Feidenhans'l fullname: Feidenhans'l, Robert organization: Condensed Matter Physics and Chemistry Department, Risø National Laboratory, DK-4000 Roskilde, Denmark – sequence: 5 givenname: Robert L. surname: Johnson fullname: Johnson, Robert L. organization: II Institut für Experimentalphysik, Universität Hamburg, Luruper Chausee 149, D-22761, Germany |
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| Cites_doi | 10.1103/PhysRevLett.76.2358 10.1103/PhysRevLett.79.4413 10.1103/PhysRevLett.77.2009 10.1107/S0021889893004364 10.1103/PhysRevB.33.3830 |
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| Keywords | X-ray diffraction Strain relaxation Nanoclusters Thin films Stress relaxation Transition elements XRD Copper Experimental study Lattice parameters |
| Language | English |
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| References | E. Vlieg to be published; C. Schamper, H.L. Meyerheim, W. Moritz, J. Appl. Crystallogr. 26 (1993) 687. Müller, Fischer, Nedelmann, Fricke, Kern (BIB1) 1996; 76 Robinson (BIB3) 1986; 33 Berg Rasmussen, Baker, Nielsen, Feidenhans'l, Johnson (BIB2) 1997; 79 Steinfort, Scholte, Ettema, Tuinstra, Nielsen, Landemark, Feidenhans'l, Falkenberg, Seehofer, Johnson (BIB4) 1996; 77 Müller (10.1016/S0921-4526(98)00199-9_BIB1) 1996; 76 Steinfort (10.1016/S0921-4526(98)00199-9_BIB4) 1996; 77 10.1016/S0921-4526(98)00199-9_BIB5 Robinson (10.1016/S0921-4526(98)00199-9_BIB3) 1986; 33 Berg Rasmussen (10.1016/S0921-4526(98)00199-9_BIB2) 1997; 79 |
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| StartPage | 34 |
| SubjectTerms | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Mechanical and acoustical properties Nanoclusters Physical properties of thin films, nonelectronic Physics Strain relaxation Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) X-ray diffraction |
| Title | Strain relaxation in thin films of Cu grown on Ni(0 0 1) |
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