Strain relaxation in thin films of Cu grown on Ni(0 0 1)

Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1 1 1) facets formed in thin Cu films when grown on Ni(0 0 1). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni in...

Full description

Saved in:
Bibliographic Details
Published inPhysica. B, Condensed matter Vol. 248; no. 1; pp. 34 - 38
Main Authors Berg Rasmussen, Frank, Baker, Jeff, Nielsen, Mourits, Feidenhans'l, Robert, Johnson, Robert L.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 01.06.1998
Elsevier
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Surface X-ray diffraction and kinematical model calculations are used to determine the strain relaxation of embedded wedges with internal (1 1 1) facets formed in thin Cu films when grown on Ni(0 0 1). We show the wedges to be inhomogenously strained with a large lateral relaxation near the Cu/Ni interface which decays rapidly away from the interface.
ISSN:0921-4526
1873-2135
DOI:10.1016/S0921-4526(98)00199-9