Fast super-resolution algorithms using one-dimensional patch-based training and directional interpolation

This study proposes, fast super-resolution algorithms to up-scale an input low-resolution image into a high-resolution image. Conventional learning-based, super-resolution algorithms require large memory space to store a huge amount of synthesis information, and they require significant computation...

Full description

Saved in:
Bibliographic Details
Published inIET image processing Vol. 6; no. 5; pp. 548 - 557
Main Authors KANG, Y. U, JEONG, S.-C, SONG, B. C
Format Journal Article
LanguageEnglish
Published Stevenage Institution of Engineering and Technology 01.07.2012
The Institution of Engineering & Technology
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:This study proposes, fast super-resolution algorithms to up-scale an input low-resolution image into a high-resolution image. Conventional learning-based, super-resolution algorithms require large memory space to store a huge amount of synthesis information, and they require significant computation because of the large number of two-dimensional matching operations. To mitigate this problem, the authors train a dictionary using one-dimensional, patch-based training and K-means clustering at the learning phase, and they use one-dimensional matching and interpolation, based on the trained dictionary at the synthesis phase. Such one-dimensional, content-adaptive interpolation is applied separately in horizontal and vertical directions. In addition, the authors propose a hybrid algorithm, in which directional interpolation is utilised for vertical interpolation to further reduce the dictionary size and the so called staircase artefact. Simulation results show, that the proposed algorithm has higher peak-to-peak, signal-to-noise ratio and structure similarity values, while providing significantly smaller dictionary size and faster computation than the latest learning-based, super-resolution algorithm.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1751-9659
1751-9667
DOI:10.1049/iet-ipr.2010.0489