Structural and fluorescence properties of thin films fabricated by pulsed laser deposition technique from Nd:KGW single crystal

Textured and amorphous thin films were deposited by KrF laser ablation of neodymium doped potassium gadolinium tungstate, KGd1−xNdx(WO4)2 (Nd:KGW) single crystal in oxygen ambient atmosphere on MgO, YAP (YAlO3) and YAG (Y3Al5O12) substrates at temperatures up to 800°C. The influence of substrate nat...

Full description

Saved in:
Bibliographic Details
Published inOptical materials Vol. 28; no. 4; pp. 360 - 369
Main Authors Lancok, J., Garapon, C., Vorlíček, V., Jelinek, M., Čerňanský, M.
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.03.2006
Elsevier Science
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Textured and amorphous thin films were deposited by KrF laser ablation of neodymium doped potassium gadolinium tungstate, KGd1−xNdx(WO4)2 (Nd:KGW) single crystal in oxygen ambient atmosphere on MgO, YAP (YAlO3) and YAG (Y3Al5O12) substrates at temperatures up to 800°C. The influence of substrate nature and substrate temperature (Ts) on films crystallinity and morphology were studied by conventional X-ray diffraction (XRD), micro-Raman spectroscopy (μRS) and scanning electron microscopy (SEM). Related emission and excitation spectra and fluorescence decay were examined. The strongly textured polycrystalline Nd:KGW films with fluorescence spectra very close to those of bulk single crystal were deposited only on YAG substrate at higher Ts, whereas the smoother films were obtained at Ts=400°C on all types of substrates. Fluorescence properties of the films corresponding to the transitions from the 4F3/2 doublet to the 4I9/2, 4I11/2 and 4I13/2 multiplets, at about 890nm, 1.06μm and 1.3μm, bring a new information about the structure of the film at the scale of the Nd3+ ions environment, which could not be detected by XRD method. The fluorescence decay was almost exponential, with a lifetime of about 110μs for polycrystalline KGW films.
ISSN:0925-3467
1873-1252
DOI:10.1016/j.optmat.2005.01.023