Collimation test of a corrected laser diode beam using lateral shearing interferometer

A lateral shearing interferometer is used for testing and verifying the collimation of a corrected laser diode beam. The laser diode beam is corrected to be circular and free from astigmatism using a previously proposed lens correcting system.

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Bibliographic Details
Published inOptics communications Vol. 274; no. 2; pp. 412 - 416
Main Authors Wang, Yi, Zhai, Hongchen, Jutamulia, Suganda, Mu, Guoguang
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 15.06.2007
Elsevier Science
Subjects
Astigmatism
Beam characteristics: profile, intensity, and power; spatial pattern formation
Beam collimation
Corrected beam
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Laser diode
Laser optical systems: design and operation
Lasers
Lateral shearing interferometer
Optics
Physics
Semiconductor lasers; laser diodes
Beam collimation
Lateral shearing interferometer
Corrected beam
Laser diode
Astigmatism
Shearing interferometer
Semiconductor lasers
Beam channeling
Laser beams
Laser diodes
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Summary:A lateral shearing interferometer is used for testing and verifying the collimation of a corrected laser diode beam. The laser diode beam is corrected to be circular and free from astigmatism using a previously proposed lens correcting system.
ISSN:0030-4018
1873-0310
DOI:10.1016/j.optcom.2007.02.039