Implementation of Waveguide Terminations With Low-Passive Intermodulation for Conducted Test Beds in Backward Configuration

This letter proposes a simple procedure to implement low-passive intermodulation (PIM) terminations in waveguide technology to measure conducted backward PIM. The procedure consists in inserting a filter before the waveguide termination of the test bench. This approach reduces the PIM contribution f...

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Bibliographic Details
Published inIEEE microwave and wireless components letters Vol. 29; no. 10; pp. 659 - 661
Main Authors Smacchia, Davide, Soto, Pablo, Guglielmi, Marco, Morro, Jose Vicente, Boria, Vicente, Raboso, David
Format Journal Article
LanguageEnglish
Published IEEE 01.10.2019
Subjects
Connectors
Frequency measurement
Intermodulation distortion
Loaded waveguides
Loss measurement
low-pass filters
microwave filters
passive circuits
PIM mitigation
Radio frequency
Transmission line measurements
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Summary:This letter proposes a simple procedure to implement low-passive intermodulation (PIM) terminations in waveguide technology to measure conducted backward PIM. The procedure consists in inserting a filter before the waveguide termination of the test bench. This approach reduces the PIM contribution from the load and, consequently, lowers the residual PIM noise floor of the test bench. To validate the procedure, a conducted backward low-PIM setup working in K-band has been assembled and tested. The PIM performance improvement obtained fully confirms the validity of the proposed solution.
ISSN:1531-1309
1558-1764
DOI:10.1109/LMWC.2019.2933600