Capacity detection of internal short circuit
•Advanced detection of internal short circuit.•Analysis of electrochemical sources internal short circuit.•Concept of a new advanced diagnostic method for internal short circuit of cells. The most critical defect in electrochemical cells is connected with internal short circuit (ISCr) occurrence. It...
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Published in | Journal of energy storage Vol. 15; pp. 345 - 349 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Elsevier Ltd
01.02.2018
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Subjects | |
Online Access | Get full text |
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Summary: | •Advanced detection of internal short circuit.•Analysis of electrochemical sources internal short circuit.•Concept of a new advanced diagnostic method for internal short circuit of cells.
The most critical defect in electrochemical cells is connected with internal short circuit (ISCr) occurrence. It may cause a thermal runaway which can even lead to explosion of the cell. Although the causes are well know (manufacturing defect, overcharging, overdischarging), the timely detection of ISCr is very difficult.
This work focuses on the detection of an internal short circuit while the cell is being charged using the time dependence of the capacity evaluation. |
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ISSN: | 2352-152X 2352-1538 |
DOI: | 10.1016/j.est.2017.12.006 |