Thin and thick cross shaped metal grids

Thin cross shaped metal grids have been studied in the infrared for wavelengths smaller and larger than the periodicity constant. Resonance frequencies of thin grids, calculated using rigorous computational methods, agree well with experimental data and empirical formulas. Resonance wavelength and t...

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Bibliographic Details
Published inInfrared physics & technology Vol. 40; no. 6; pp. 475 - 485
Main Authors Möller, K.D, Farmer, K.R, Ivanov, D.V.P, Sternberg, O, Stewart, K.P, Lalanne, P
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.12.1999
Elsevier
Subjects
Exact sciences and technology
Fundamental areas of phenomenology (including applications)
Infrared
Infrared transmitting materials
Metal grid
Optical materials
Optics
Physics
Silicon substrate
Infrared
Metal grid
Silicon substrate
Electromagnetic wave transmission
Theoretical study
Infrared radiation
Optical materials
Silicon
Layer thickness
Substrates
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Summary:Thin cross shaped metal grids have been studied in the infrared for wavelengths smaller and larger than the periodicity constant. Resonance frequencies of thin grids, calculated using rigorous computational methods, agree well with experimental data and empirical formulas. Resonance wavelength and the Wood anomaly of metal meshes on silicon substrates show frequency shifts to longer wavelength, with shifts smaller than the refractive index for the resonance and equal to the refractive index for the Wood anomaly. An empirical formula for the wavelength of the “thickness” peak of free standing thick cross shaped grids is shown and agrees very well with experimental and computational results.
ISSN:1350-4495
1879-0275
DOI:10.1016/S1350-4495(99)00031-6